Parity Error Detection Circuit for Post-Amble-Free Memory Strobes

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Solution Overview

Problem

High-speed memory devices face challenges in maintaining stable operation due to increased error probability, and existing parity error detection circuits fail to comply with communication protocols when data strobe signals lack a post-amble, leading to incorrect parity output signals.

Innovation Solution

Incorporating a parity error detection circuit that performs parity checks on data sampled by a data strobe signal without a post-amble, generating a parity error signal based on the burst length of the data, ensuring compliance with communication protocols by adjusting the output time period according to the burst length.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the operating speed of the memory device is increased, then the data processing capacity is improved, but the probability of error generation increases

Engineering Contradiction:
Improvedata processing capacityVSAvoiderror probability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements a parity error detection circuit that performs feedback verification on data received through the data strobe signal. The circuit calculates parity bits and compares them with received parity information to detect errors, creating a closed-loop feedback mechanism that monitors and corrects transmission errors at high speeds without compromising reliability

Inventive Principle:
Principle #23Feedback

2Device complexity

If a traditional parity error detection circuit is used with data strobe signals lacking post-amble, then the device complexity is reduced, but the compliance with communication protocols deteriorates

Engineering Contradiction:
Improvecircuit structureVSAvoidprotocol compliance
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The patent employs dynamic timing control where the parity output signal is maintained until a specific time point determined by burst length parameters. This dynamic adjustment of signal duration allows the circuit to comply with various communication protocols (such as JEDEC standards) without requiring complex protocol-specific circuit designs, achieving adaptability through temporal flexibility rather than structural complexity

Inventive Principle:
Principle #15Dynamics

3Loss of time

If the parity output signal is reset immediately after parity check, then the response time is reduced, but the compliance with communication protocols requiring maintained output deteriorates

Engineering Contradiction:
Improveresponse timeVSAvoidprotocol compliance
Core Design Contradiction:
Loss of timeVSAdaptability or versatility

Solution Approach 1:

The patent pre-calculates and stores the time point at which the parity output signal should be maintained based on burst length parameters before actual data transmission occurs. This preliminary determination of signal duration allows the system to quickly process parity checks while ensuring the output signal persists for the correct duration required by communication protocols, eliminating the need for immediate reset

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10243584B2Memory device including parity error detection circuit
Publication Date: 2019.03.26 SAMSUNG ELECTRONICS CO LTD
  • US10243584B2 patent drawing
  • US10243584B2 patent drawing
  • US10243584B2 patent drawing

AI summary

A memory device including a parity check circuit and a mask circuit may be provided. The parity check circuit may perform parity check on data sampled according to a data strobe signal, which does not include a post-amble. The mask circuit may generate a parity error signal based on results of the parity check, and output the parity error signal during a time period determined according to a burst length of the data.