Partial Field Imprint Control via Calibration Data
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Solution Overview
Problem
Nanoimprint lithography systems face challenges in achieving precise control over the initial contact point (ICP) for small partial fields, leading to higher defectivity and processing time.
Innovation Solution
A method to determine a set of initial contact control values based on calibration data, desired initial contact points, and partial field shape descriptions, which includes template cavity pressure, substrate pressure, and template tilt, to accurately imprint small partial fields.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If traditional nanoimprint lithography is used for small partial fields, then the process can be performed, but defectivity increases and processing time increases
Solution Approach 1:
The patent applies preliminary action by performing calibration measurements and establishing calibration data before the actual imprinting process. The system measures the relationship between control values (template cavity pressure, substrate pressure, template tilt) and initial contact points during calibration, then uses this pre-acquired data to determine optimal control values for subsequent imprinting operations, thereby achieving precise ICP control without time-consuming real-time experimentation
Solution Approach 2:
The patent implements feedback by using measured initial contact points from calibration data to iteratively determine and refine control values for imprinting. The system compares the actual measured ICP with the desired ICP and adjusts control values accordingly, creating a closed-loop control system that continuously optimizes the imprinting process based on actual performance data
2Manufacturing precision
If traditional nanoimprint lithography is used for small partial fields, then the process can be performed, but defectivity increases
Solution Approach 1:
The patent applies preliminary action by performing calibration measurements and establishing calibration data before the actual imprinting process. The system measures the relationship between control values (template cavity pressure, substrate pressure, template tilt) and initial contact points during calibration, then uses this pre-acquired data to determine optimal control values for subsequent imprinting operations, thereby achieving precise ICP control without time-consuming real-time experimentation
Solution Approach 2:
The patent implements feedback by using measured initial contact points from calibration data to iteratively determine and refine control values for imprinting. The system compares the actual measured ICP with the desired ICP and adjusts control values accordingly, creating a closed-loop control system that continuously optimizes the imprinting process based on actual performance data
3Manufacturing precision
If extensive experimentation is performed to determine initial contact control values, then manufacturing precision improves, but processing time increases
Solution Approach 1:
The patent applies preliminary action by performing calibration measurements and establishing calibration data before the actual imprinting process. The system measures the relationship between control values (template cavity pressure, substrate pressure, template tilt) and initial contact points during calibration, then uses this pre-acquired data to determine optimal control values for subsequent imprinting operations, thereby achieving precise ICP control without time-consuming real-time experimentation
Solution Approach 2:
The patent uses copying by creating a digital model or lookup table from calibration data that represents the relationship between control values and initial contact points. This digital copy allows the system to quickly determine optimal control values for new imprinting operations without physically re-testing each scenario, thereby maintaining high precision while significantly reducing the time required for process setup
Data Source
AI summary
A system and method for shaping a film on a partial field which may include determining a set of initial contact control values based on: a superset of calibration data; a desired initial contact point; and a partial field shape description. The system and Method may also include imprinting the partial field with the set of initial contact control values.


