Partial-Image Electromagnetic Inspection for Faster Quality Checks
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing inspection methods for articles, such as packaged food, require extensive image processing after acquiring the entire image, leading to prolonged inspection times and potential bottlenecks in production lines.
Innovation Solution
An inspection apparatus that generates partial images of the article using electromagnetic waves, performs image processing on each partial image in real-time, and combines them to form a composite image for quality determination, allowing parallel inspection and processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the entire image is divided into multiple first partial images and multiple second partial images for inspection, then the inspection accuracy is improved, but the inspection time is significantly prolonged
Solution Approach 1:
The patent divides the image acquisition and processing into multiple segments (first partial images and second partial images) that are processed in parallel. Each segment is independently analyzed for abnormalities, and the results are combined to determine overall quality, thereby maintaining high inspection accuracy while reducing total processing time through concurrent operations.
Solution Approach 2:
The patent performs preliminary image processing and abnormality detection on partial images while the article is still moving through the inspection system. By preprocessing image segments before complete image assembly, the system prepares data in advance for final quality determination, reducing the critical path time for inspection.
2Productivity
If the inspection apparatus processes the entire image sequentially, then the processing is simple, but the inspection speed becomes a bottleneck in the production line
Solution Approach 1:
The patent implements continuous image acquisition and processing where multiple partial images are captured, processed, and analyzed simultaneously as the article moves through the inspection zone. This continuous parallel processing eliminates idle time and maintains constant inspection throughput, preventing the apparatus from becoming a production line bottleneck.
Solution Approach 2:
The patent transitions from sequential one-dimensional processing to parallel multi-dimensional processing by simultaneously handling multiple image segments across different spatial regions. This dimensional expansion of processing allows the system to inspect multiple areas of the article concurrently, dramatically increasing inspection speed without proportionally increasing device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces the time required for quality inspection, enabling high-speed determination of article quality without causing bottlenecks in production lines.
Implementation Method 1
an image generation unit configured to develop one dimensional transmission signal of an article to be inspected that passes over an irradiation line of an electromagnetic wave
Data Source
Figure 1
Figure 2
Figure 3
AI summary
An inspection apparatus includes an image generation unit configured to develop one dimensional transmission signal of an article to be inspected passing through an irradiation line of electromagnetic wave into a two dimensional image on a memory, an image processing unit configured to perform image processing on a partial image every time the partial image including a part of article to be inspected is generated in the image generation unit, and an inspection unit configured to inspect a quality of the partial image after image processing, based on one or more processing results of the image processing unit.