Particle Detection Device with Self-Diagnostic Mirror Cleaning
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Solution Overview
Problem
Conventional particle detection devices face issues with accurate detection due to particles adhering to the light-collection mirror, which changes the light-reflection properties and affects the intensity of scattered light detected, leading to inaccurate particle detection.
Innovation Solution
A particle detection device is designed with a first and second light source, a concave-shaped light-collection member, and a light-reception element that uses both irradiation lights to detect scattered light and reflected light, allowing for the assessment of dirt on the light-collection member, thereby adjusting the operation based on the detected change in light-reflection properties.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a light-collection mirror is used to collect scattered light from particles, then the detection sensitivity of particles is improved, but the light-collection mirror accumulates dirt which changes its light-reflection properties and causes detection inaccuracy
Solution Approach 1:
The patent implements a feedback mechanism by introducing a second light source that emits light toward the light-collection mirror, and using the same light-reception element to detect the reflected light from the mirror surface. The control unit compares the detected reflected light intensity with a reference value to determine the dirt accumulation degree, and automatically corrects the particle detection results based on this feedback information, thereby maintaining detection reliability despite dirt accumulation on the mirror
Solution Approach 2:
The system performs self-diagnosis and self-correction by using its own light-reception element to monitor the condition of the light-collection mirror. The second light source illuminates the mirror surface, and the light-reception element detects the reflected light to assess the mirror's cleanliness. This self-service mechanism allows the system to automatically compensate for dirt-induced measurement errors without external intervention
2Productivity
If the light-collection mirror is continuously used for particle detection, then the productivity of the detection device is improved, but the dirt accumulation on the mirror changes light-reflection properties and degrades measurement precision over time
Solution Approach 1:
The patent enables continuous operation of the particle detection device by implementing a monitoring mechanism that operates concurrently with the main detection function. The second light source continuously illuminates the light-collection mirror, and the light-reception element continuously monitors the reflected light intensity, allowing the system to maintain measurement precision throughout continuous operation by detecting and correcting dirt accumulation effects in real-time
Solution Approach 2:
The system performs preliminary assessment of the light-collection mirror's condition by detecting reflected light before it affects particle detection accuracy. The control unit continuously monitors the reflected light intensity from the mirror surface and proactively corrects measurement results based on the detected dirt accumulation degree, preventing precision degradation before it occurs
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables accurate detection of the degree of dirt on the light-collection member, improving the reliability of particle detection by correcting for changes in light-reflection properties and enhancing the detection efficiency of particles.
Implementation Method 1
a first light source to emit first irradiation light traveling in the target space
Implementation Method 2
scattered light generated when a particle existing at a predetermined detection position in the target space is irradiated with the first irradiation light
Implementation Method 3
a light ray of the second irradiation light that is reflected at the first reflection surface and a light ray of the second irradiation light that is reflected at both the first reflection surface and the second reflection surface
Data Source
AI summary
A particle detection device includes: a first light source to emit first irradiation light; a first light-collection member; a second light-collection member facing the first reflection surface; a second light source to emit second irradiation light; and a first light-reception element. When the first light source emits the first irradiation light, the first light-reception element detects, as the first incident light, scattered light generated when a particle existing at a detection position in a target space is irradiated with the first irradiation light. When the second light source emits the second irradiation light, the first light-reception element detects, as the first incident light, a light ray of the second irradiation light that is reflected by the first reflection surface and a light ray of the second irradiation light that is reflected by both the first reflection surface and the second reflection surface.