Particle Image Analysis Using Dark Field Illumination
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional particle image analyzing apparatuses require complex and time-consuming preparation of suspension liquids and lack efficient methods for analyzing transparent particle images to obtain morphological feature information.
Innovation Solution
A particle image analyzing apparatus with a dark field illumination unit, imaging unit, and image processing unit that extracts particle images based on a threshold value greater than the background luminance, enabling efficient analysis of particle morphological features without the need for pre-treating transparent particles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If transparent particles are mixed with non-transparent particles using electrostatic attachment to make them visible, then the particles can be imaged, but the preparation process becomes complex and time-consuming
Solution Approach 1:
The invention extracts and eliminates the unnecessary step of mixing transparent particles with non-transparent particles. Instead, it directly images the transparent particles using dark field illumination, removing the complex preparation process involving suspension liquids and electrostatic attachment while maintaining particle visibility and measurement precision.
Solution Approach 2:
The invention changes the illumination parameter from conventional light to dark field illumination. This parameter change enables direct imaging of transparent particles without modifying the particles themselves or requiring complex preparation steps, thus resolving the contradiction between measurement precision and preparation complexity.
2Ease of operation
If conventional illumination is used to image transparent particles, then the imaging process is simple, but the particles cannot be clearly visualized and analyzed
Solution Approach 1:
The invention changes the illumination parameter from conventional light to dark field illumination. This parameter change simultaneously improves particle image quality and maintains operational simplicity, as the dark field illumination is implemented through a straightforward optical configuration without complex sample preparation.
3Quantity of substance
If threshold value smaller than background luminance is used for image extraction, then more particles can be detected, but background noise increases and analysis accuracy decreases
Solution Approach 1:
The invention uses the luminance characteristics of dark field illumination to establish an appropriate threshold value for particle image extraction. The dark field illumination creates a high contrast between particles and background, enabling the use of an appropriate threshold that accurately distinguishes particles from background noise, thus maintaining both detection quantity and analysis accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Simplifies the imaging process by allowing direct analysis of transparent particles and rapidly obtaining morphological feature information, reducing the complexity and time required for imaging and analysis.
Implementation Method 1
an zonal light generating unit (dark field illuminating unit) for converting the exit window from the light source to an zonal light
Data Source
AI summary
A particle image analyzing apparatus for analyzing an image of an imaged particle, the particle image analyzing apparatus comprising:an illuminating unit for providing dark field illuminationng the a particle; an imaging unit for acquiring capturing an imaged image by imaging imaging the dark field illuminated particle; and an image processing unit for extracting a particle image from the imaged image captured by the imaging unit , based on a threshold value larger than a luminance value substantially corresponding to the background of the particle image, and analyzing the extracted particle image to obtain morphological feature information indicating the morphological feature of the particle; wherein the image processing unit extracts the particle image from the imaged image based on a threshold value larger than a luminance value substantially corresponding to the background of the particle image.