3D Light Spot Correction for Consistent Particle Measurement

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Solution Overview

Problem

Existing particle measurement technologies face challenges in maintaining consistent detection sensitivity due to individual apparatus characteristics, such as variations in emission angle, coherence length, and objective lens mounting, leading to fluctuations in detection signals when measuring microparticles in a solvent.

Innovation Solution

A particle measurement apparatus that corrects detection sensitivity fluctuations by using a correction function based on the irradiation position of the light spot in the X, Y, and Z directions, employing polynomial or Gaussian distribution models to account for individual apparatus characteristics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If three-dimensional light spot scanning is performed to measure particles, then measurement capability is improved, but detection sensitivity fluctuations occur due to individual apparatus characteristics

Engineering Contradiction:
Improveparticle size measurement precisionVSAvoiddetection signal consistency
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The invention introduces a detection sensitivity correction function that adjusts detection signals based on light spot position parameters (X, Y, Z coordinates). By changing the detection parameters dynamically according to the scanning position, the system compensates for apparatus characteristics such as emission angle variations and coherence length differences, thereby maintaining consistent detection sensitivity across three-dimensional scanning while preserving measurement precision.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If light spot scanning speed is increased to account for Brownian motion, then measurement accuracy is improved, but detection sensitivity fluctuations due to apparatus characteristics remain

Engineering Contradiction:
Improveparticle size measurement precisionVSAvoiddetection signal consistency
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The invention implements a feedback mechanism where the detection sensitivity correction function continuously adjusts detection signals based on the light spot's position during scanning. This feedback loop compensates for apparatus characteristics in real-time, allowing the system to maintain both high scanning speed (to account for Brownian motion) and consistent detection sensitivity across different apparatuses.

Inventive Principle:
Principle #23Feedback

3Reliability

If individual apparatus characteristics are accounted for, then detection sensitivity consistency is improved, but measurement complexity increases

Engineering Contradiction:
Improvedetection signal consistencyVSAvoidcorrection function complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The invention applies local quality correction by introducing position-dependent correction factors (CX, CY, CZ) that are specific to each light spot location. Instead of a uniform correction approach, the system adjusts detection sensitivity locally based on the X, Y, and Z position, thereby accounting for apparatus characteristics without requiring complex overall system redesign. This localized correction maintains reliability while managing complexity.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus effectively reduces detection sensitivity fluctuations, ensuring precise measurement of particle size and concentration by minimizing variations across different apparatuses, thereby improving measurement accuracy and consistency.

Implementation Method 1

irradiating the particles with light, and correcting the size of the particles

Methodology Applied
Scientific EffectLight focusing: Focusing

Implementation Method 2

measuring the size of particles in a liquid sample by irradiating the particles with light

Methodology Applied
Scientific EffectOptical measurement: Light

Implementation Method 3

detecting the light reflected from the target

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 4

measuring an object to be tested whose size is approximately three times or less the size of the light spot

Methodology Applied
Scientific EffectLight scattering: Scattering

Data Source

PatentEP4657043A1Particle measurement apparatus
Publication Date: 2025.12.03 HITACHI HIGH TECH ANALYSIS CORP
  • EP4657043A1 patent drawingFigure 1~2
  • EP4657043A1 patent drawingFigure 3
  • EP4657043A1 patent drawingFigure 4A~4B

AI summary

A particle measurement apparatus of the invention measures the size of particles in a liquid sample by irradiating the particles with light, and corrects the size of the particles using a correction function that uses as an input value the irradiation position of the light spot in at least one of the X, Y and Z directions.