Particle Sensing Circuit for SEU Error Correction in Integrated Circuits
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Solution Overview
Problem
Integrated circuits are susceptible to Single Event Upsets (SEUs) due to high energy particle strikes, leading to errors and malfunctions, and existing error detection and correction methods require complex circuitry and high power consumption.
Innovation Solution
An integrated circuit with a particle sensing circuit, including a diode circuit implanted below transistors, detects cosmic particles and generates an error detection signal, allowing for selective error correction based on particle energy, reducing power consumption by minimizing the operational frequency of error checking circuitry.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If EDCRC and scrubbing circuitry are used to detect and correct SEUs, then error detection capability is improved, but power consumption increases and voltage supply noises occur
Solution Approach 1:
The patent implements preliminary error detection by continuously monitoring critical nodes for SEUs using dedicated detection circuitry. This allows errors to be identified before they propagate through the system, enabling corrective action to be taken promptly. The detection circuitry is positioned to catch errors at their source, preventing the need for more extensive error checking operations later.
Solution Approach 2:
The error detection and correction system is divided into separate functional modules: detection circuitry for identifying SEUs, correction circuitry for fixing detected errors, and control logic for coordinating operations. This segmentation allows each module to operate independently and efficiently, reducing overall power consumption compared to a monolithic EDCRC approach that would require all components to operate simultaneously at high power.
2Reliability
If EDCRC and scrubbing circuitry scan the entire IC for errors, then error detection coverage is improved, but detection time increases
Solution Approach 1:
The patent applies local quality by placing detection circuitry specifically at critical nodes where SEUs are most likely to occur and have the most significant impact. Rather than uniformly scanning the entire IC, the system concentrates detection resources at vulnerable locations such as memory cells, registers, and logic gates that are prone to single-event upsets. This localized approach maintains high error detection coverage for critical functions while minimizing the time and power required for monitoring.
Solution Approach 2:
The detection circuitry is positioned to identify errors at their source before they can propagate through the system. By implementing preliminary detection at critical nodes, the system can catch SEUs immediately upon occurrence and initiate correction before the error affects other parts of the circuit, significantly reducing detection time compared to comprehensive scanning approaches.
3Reliability
If EDCRC and scrubbing circuitry run constantly to detect SEUs, then error detection reliability is improved, but voltage supply noises increase
Solution Approach 1:
The patent implements periodic error detection by having the detection circuitry operate in cycles rather than continuously. The system monitors critical nodes at regular intervals, checking for SEUs at strategically selected moments in the operation cycle. This periodic monitoring maintains reliable error detection capability while allowing the system to enter low-power states between checks, thereby reducing voltage supply noises that would result from constant operation of extensive error checking circuitry.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively detects and corrects SEUs with reduced power consumption and voltage noise, enhancing the reliability of integrated circuits by localizing error detection and correction within the integrated circuit.
Implementation Method 1
The particle sensing circuit includes a diode circuit that collects charges generated by the cosmic particle
Implementation Method 2
a diode circuit that collects charges generated by the cosmic particle
Data Source
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AI summary
An integrated circuit for detecting and correcting error events associated with atomic particles includes error detection circuitry connected to monitoring circuitry. The error detection circuitry may include a particle sensing circuit (e.g., a diode circuit) embedded below a substrate surface of the integrated circuit, and a particle validation circuit (e.g., a sense amplifier) coupled to the particle sensing circuit through a conductive via. The particle sensing circuit may detect and collect stray charges generated by an atomic particle passing through the integrated circuit. A particle validation circuit may generate an output signal that is indicative of the particle energy of the atomic particle based on the collected stray charge by the particle sensing circuit. Monitoring circuitry may identify the particle energy based on the output signal and subsequently generate an error correction signal, which activates error correction operations in the integrated circuit.