Particle Size Measurement System Using Segmented Optical Detection

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Solution Overview

Problem

Existing methods for measuring particle-size distributions, particularly for bulk materials with wide size ranges, face challenges such as increased complexity and measurement errors for smaller particles, limited range of application, and lack of detailed contour information due to optical resolution issues and single measurement principle reliance.

Innovation Solution

A method using multiple optical measurement methods, including diffraction pattern capture and projection surface area analysis, to determine particle-size distributions over a wide range, enabling online measurement and improved accuracy by combining data from different methods like laser diffraction and contour processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If electro-optical image recording appliances are used to measure particle sizes, then measurement capability for particles >100 μm is achieved, but measurement complexity and errors increase greatly for particles <100 μm

Engineering Contradiction:
Improveparticle size measurement accuracyVSAvoidmeasurement complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement system is segmented into multiple independent measurement channels, each optimized for specific particle size ranges. The image recording appliance handles particles >100 μm while the laser diffraction appliance handles particles <100 μm, allowing each component to operate within its optimal performance range without compromising overall system accuracy.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The measurement device is designed with multi-functionality to handle particles across a wide size spectrum (from sub-100 μm to >100 μm). By integrating both image recording and laser diffraction capabilities into a single device, the system achieves universal particle size measurement capability while maintaining simplicity through unified hardware architecture.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If laser diffraction is used to capture small particles (1-100 μm), then efficient capture of small particles is achieved, but high complexity for simultaneous capturing of larger particles (>1 mm) occurs

Engineering Contradiction:
Improvesmall particle measurement accuracyVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement system is segmented into two functional appliances: an image recording appliance for particles >100 μm and a laser diffraction appliance for particles <100 μm. This segmentation allows each appliance to be optimized for its specific size range, avoiding the complexity of designing a single appliance to handle the entire spectrum from 1 μm to >1 mm.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent merges the image recording appliance and laser diffraction appliance into a single integrated measurement device. This combination allows the system to simultaneously measure particles across all size ranges (1-100 μm and >100 μm) without requiring separate devices, thereby reducing overall system complexity while maintaining high measurement precision for both small and large particles.

Inventive Principle:
Principle #5Merging (Combining)

3Adaptability or versatility

If only one measurement principle is used, then device simplicity is maintained, but range of application and information content are limited

Engineering Contradiction:
Improvemeasurement rangeVSAvoidmeasurement complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The measurement device incorporates multiple measurement principles (image recording and laser diffraction) within a single unified system. This multi-functionality enables the device to measure particles across a wide size range (from sub-100 μm to >100 μm) and provides diverse information content including both contour details and size distribution data, significantly enhancing adaptability while managing complexity through integrated architecture.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

By merging multiple measurement appliances into a single integrated device, the system achieves comprehensive particle size measurement capability across multiple orders of magnitude. The combined system provides richer information content than single-principle methods while maintaining manageable complexity through unified hardware and coordinated measurement protocols.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for accurate measurement of particle sizes from 2 μm to 20 mm, enhancing the ability to assess distributions and adapt processing parameters, improving measurement accuracy and reliability across various applications, including cereal milling and pharmaceutical industries.

Implementation Method 1

at least one optical measurement method comprises the capturing of a diffraction pattern of the portion of the particles

Methodology Applied
Scientific EffectDiffraction: Diffraction

Implementation Method 2

disturbances owing to light diffraction or light scattering effects

Methodology Applied
Scientific EffectLight scattering: Scattering

Data Source

PatentUS8842267B2Device for determining particle sizes
Publication Date: 2014.09.23 BUHLER AG
  • US8842267B2 patent drawing
  • US8842267B2 patent drawing
  • US8842267B2 patent drawing

AI summary

A method for measuring particle size distributions of bulk materials such as cereals, cereal milling products, cereal products and the like, which is intended to enable the measurement of particle size distributions which vary by orders of magnitude. A sample of isolated particles is optically detected in an arrangement by at least two measurement methods. Preferably, detection of the contours of the particles and laser diffraction take place at the same time.