Particulate Observation Device Using Diffraction Fringe Depth Analysis
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Solution Overview
Problem
Accurate measurement of particle size and determination of physical properties in fine particles require three-dimensional position capture, and non-uniform light sources complicate scattered light intensity measurements, necessitating precise position determination within the laser light.
Innovation Solution
A particulate observation device and method using an optical microscope to image light scattered from particles, determining three-dimensional positions from two-dimensional images by analyzing bright spots and diffraction fringes, and calculating particle size and refractive index through intensity ratios, correcting for incident light intensity distribution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If laser light is used to illuminate particles for scattered light intensity measurement, then the measurement sensitivity is improved, but the non-uniform intensity distribution of laser light causes measurement errors
Solution Approach 1:
The patent applies preliminary action by measuring and storing the incident light intensity distribution before particle measurement, then using this pre-acquired information to correct the scattered light intensity measurements. The system performs a measurement of the laser light intensity profile in advance, saves this data, and subsequently uses it to compensate for non-uniform illumination during particle characterization, thereby eliminating measurement errors caused by spatial variations in light intensity.
Solution Approach 2:
The patent implements feedback by using the measured incident light intensity distribution to correct scattered light intensity measurements in real-time. The system continuously references the pre-measured light profile to adjust and correct particle measurement data, creating a closed-loop correction mechanism that compensates for illumination non-uniformity and improves measurement reliability.
2Device complexity
If two-dimensional images are used for particle observation, then the device complexity is reduced, but the particle size measurement accuracy deteriorates due to inability to capture three-dimensional position information
Solution Approach 1:
The patent applies dimensionality change by extracting three-dimensional position information (including depth/z-coordinate) from two-dimensional particle images. The system uses the known laser light intensity distribution profile and the measured scattered light intensity to calculate the particle's position along the optical axis, effectively adding a depth dimension to the two-dimensional image data without requiring complex three-dimensional imaging hardware.
Solution Approach 2:
The patent uses the incident light intensity distribution as an intermediary to bridge two-dimensional imaging and three-dimensional position determination. By introducing this intermediate information layer (the pre-measured light profile), the system can infer depth position from two-dimensional scattered light intensity measurements, enabling accurate particle size determination without complex 3D imaging systems.
3Ease of operation
If scattered light intensity is measured without correcting for incident light distribution, then the measurement process is simplified, but the determination of physical properties such as refractive index becomes inaccurate
Solution Approach 1:
The patent applies preliminary action by pre-measuring and storing the incident light intensity distribution before particle measurement. This pre-acquired light profile information is then used to correct scattered light intensity measurements, enabling accurate refractive index determination without adding complexity to the actual particle measurement process. The correction step becomes a straightforward calculation using pre-prepared reference data.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate measurement of particle size and physical properties by determining three-dimensional positions and correcting for light intensity variations, improving measurement precision and reducing errors from particle size distributions.
Implementation Method 1
a method of measuring a particle size of fine particles in a dispersion medium, a method of obtaining the particle size by emitting laser light onto the dispersion medium in an optical cell and successively imaging the motion of the particles by a video camera to capture movement
Implementation Method 2
the optical microscope unit provides the two-dimensional image by considering bright spots having diffraction fringes to be the particles
Implementation Method 3
with a particle having a diameter that is sufficiently smaller than the wavelength of laser light, because light scattering undergoes Rayleigh scattering, a scattered light intensity I is represented by a proportional relationship
Data Source
AI summary
The purpose of the present invention is to provide a particulate observation device using light scattering, which includes a means for determining the three-dimensional position of a particle, and can measure an accurate particle size or impart various properties of same. The present invention is characterized by including a position determination means which captures, with an optical microscope, an image of light scattered from particles in a dispersion medium to which laser light is emitted, and determines a three-dimensional position of each particle from the obtained two dimensional image, wherein the position determination obtains two-dimensional coordinates along the two-dimensional image from luminescent point positions of the particles, and determines the depth position along a coordinate axis vertical to the two-dimensional image from the diameters of diffraction fringes of the luminescent points.