Partition Wall Leakage Current Blocking and Defect Detection
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Solution Overview
Problem
Existing display devices lack an effective method to detect defects in the partition wall, which can lead to leakage currents and short circuit issues, affecting the manufacturing yield and performance of the display.
Innovation Solution
A display device design that includes a partition wall with a first portion made of a metal material and a second portion made of a metal oxide, allowing for the detection of short circuit defects and blocking leakage currents. This design improves the process yield by inspecting short circuit defects during manufacturing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a partition wall is disposed on the pixel defining layer to separate pixel areas, then the pixel areas are effectively separated, but defects in the partition wall cannot be detected
Solution Approach 1:
A signal line is introduced as an intermediary element that makes contact with the partition wall. This signal line serves as a mediator to transmit electrical signals through the partition wall, enabling the detection of defects such as short circuits that would otherwise be undetectable. The signal line approach allows indirect measurement of partition wall integrity without requiring direct observation or complex inspection equipment.
2Object-affected harmful factors
If the partition wall is made of metal material to block leakage currents, then leakage current blocking is improved, but short circuit defects cannot be inspected
Solution Approach 1:
A driver is configured to apply a test signal to the partition wall through the signal line and measure the current value in response. This creates a feedback mechanism where the electrical response of the partition wall is measured and can indicate the presence of short circuit defects. The feedback loop enables active testing of the partition wall's electrical integrity while maintaining its leakage current blocking function.
3Ease of manufacture
If a simple partition wall structure is used, then the manufacturing process is simpler, but defects lead to poor manufacturing yield
Solution Approach 1:
The signal line and driver are incorporated into the manufacturing process to enable preliminary testing of the partition wall before final product completion. By performing defect detection early in the manufacturing process, defective products can be identified and removed before they affect overall yield. This preliminary action approach allows for quality control without requiring complex additional manufacturing steps.
Data Source
AI summary
A display device includes a substrate on which a display area and a non-display area adjacent to the display area are defined, a first electrode disposed in the display area on the substrate, a pixel defining layer disposed on the substrate and exposing at least a portion of the first electrode, a partition wall disposed on the pixel defining layer, where the partition wall includes a first portion including a metal material and a second portion surrounding the first portion and including a metal oxide, a light emission layer disposed on the first electrode and the partition wall, where at least a portion of the light emission layer is cut off by the partition wall, and a second electrode disposed on the light emission layer and the partition wall.