Semiconductor Test Circuit Layout With Fork-Plug Reconfiguration
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Solution Overview
Problem
The use of thick, low-resistance wire stock for connecting electrical components in semiconductor testing requires significant time and effort due to the stiffness and rigidity of these connections, making it difficult to change connections efficiently during testing.
Innovation Solution
The semiconductor component test device employs fork plugs or busbar connectors to facilitate easy connection and disconnection by positioning them through openings in a partitioning wall, allowing for quick changes in the connection configuration without altering the wire connections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If thick, low-resistance wire stock is used for connection lines to handle several hundred amperes of current, then electrical conductivity is improved, but flexibility and ease of connection changes deteriorate
Solution Approach 1:
The connection system is divided into separate components: rigid conductor plates (204) provide electrical conductivity, while flexible fork plugs (205) provide connection flexibility. This segmentation allows each component to optimize its function without compromise.
Solution Approach 2:
The fork plug acts as an intermediary component between the connection line and the conductor plate. It mediates the connection, allowing easy insertion and removal while maintaining reliable electrical contact through the conductor plate's low-resistance path.
2Reliability
If thick connection lines are used to carry large current, then current carrying capacity is improved, but connection changing time increases
Solution Approach 1:
The connection system transitions from static, permanently fixed thick wire connections to a dynamic system where fork plugs can be quickly inserted and removed. This allows the connection state to change rapidly while maintaining current carrying capacity through the conductor plates.
Solution Approach 2:
The fork plugs are designed as simple, easily replaceable components that can be quickly inserted and removed. While the conductor plates remain permanent, the fork plugs serve as temporary, easily changeable connection elements that reduce setup time.
3Ease of operation
If fork plugs are used to change connection position, then ease of connection changes is improved, but device complexity increases
Solution Approach 1:
The fork plugs serve multiple functions: they provide mechanical connection, electrical contact, and positioning guidance. This multi-functionality reduces the need for additional specialized components, thereby limiting the increase in overall device complexity.
Data Source
AI summary
In this testing device, a space in which a transistor 117 is disposed and a space in which a driving circuit for testing is disposed are separated by a partition wall 214. The driving circuit has a plurality of switch circuit boards 201, and a conductive plate 204 for connection is attached to the switch circuit board 201. A fork plug 205e is connected to a collector c terminal of the transistor 117 to be tested, and a fork plug 205c is connected to an emitter e terminal. The insertion of the fork plug 205 into an opening 216 provided in the partition wall 214 allows the connection of the fork plug 205 and the conductive plate 204. By changing the position of the opening 216 for inserting the fork plug 205, the connection to the driving circuit can be changed in accordance with an item to be tested.