Partitioned IC Noise Testing for Operational Edge Failure Detection
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Solution Overview
Problem
Detection of failures on the operational edge of chip designs is difficult due to these failures being close to or within the operational uncertainty range, making them hard to observe in existing testing methods.
Innovation Solution
The introduction of controlled noise to shift the distribution boundaries, allowing for the detection of previously undetectable failures by perturbing the voltage and temperature noise environment within partitioned regions of integrated circuits, using noise generators and monitors to identify design-related issues and defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If temperature and applied voltage are used to separate good die from bad die, then manufacturing testability is improved, but detection precision for operational edge failures deteriorates
Solution Approach 1:
The patent introduces noise as a new test parameter alongside temperature and voltage. By varying noise characteristics (amplitude, frequency, duration) and combining them with temperature and voltage conditions, the system creates multiple-dimensional test space that enables detection of failures at operational edges that were previously undetectable with traditional single-parameter methods
Solution Approach 2:
The patent segments the chip into multiple regions that can be independently tested. Each region can be selectively activated and tested under specific noise, temperature, and voltage conditions, allowing localized detection of operational edge failures while maintaining the ability to test the entire chip
2Measurement precision
If noise is applied to shift distribution boundaries for failure detection, then detection precision for operational edge failures is improved, but device complexity increases
Solution Approach 1:
The noise generator and noise monitor circuits are designed to serve multiple functions: generating noise for failure detection, monitoring noise effects in real-time, and providing feedback for adaptive testing. This multi-functionality reduces the need for separate dedicated circuits for each function, thereby limiting the increase in device complexity
Solution Approach 2:
The noise monitor continuously monitors the effects of generated noise and provides feedback to the noise generator and test controller. This self-service mechanism enables automatic adjustment of noise parameters and real-time detection without requiring external intervention, simplifying the overall system architecture
3Manufacturing precision
If partitioned regions are tested independently, then manufacturing precision for localized defect identification is improved, but loss of time for comprehensive testing increases
Solution Approach 1:
The patent implements dynamic testing where the test controller can selectively activate different region combinations based on previous test results and failure patterns. This dynamic adaptation allows the system to focus testing time on the most critical regions or regions showing signs of operational edge failures, reducing overall testing time while maintaining localized defect identification precision
Solution Approach 2:
The noise generator and noise monitor operate continuously during testing to provide uninterrupted monitoring of noise effects. This continuous action enables real-time detection and immediate feedback, allowing the test controller to make instant decisions about which regions to test next, thereby reducing idle time and optimizing the overall testing process
Data Source
AI summary
A system comprises a plurality of regions, wherein ones of the plurality of regions are partitioned from others of the plurality of regions and at least one of the plurality of regions is a region under test. The system comprises at least one noise generator configured to generate noise in at least the region under test, and at least one noise monitor configured to monitor one or more effects of the noise generated in the region under test. The system comprises a test controller configured to: cause the at least one noise generator to generate the noise in at least the region under test; receive information from the at least one noise monitor indicative of the one or more effects of the noise generated in the region under test; and determine one or more conditions based on at least a portion of the received information.