Path-Based Contour Extraction for Sub-Pixel Material Interfaces

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Solution Overview

Problem

Existing contour line extraction frameworks in scientific instruments are inaccurate, subjective, and fail to differentiate between different material interfaces, leading to sub-pixel inaccuracies and loss of information.

Innovation Solution

A system that subdivides contour lines into a set of barrier lines using a filter kernel and neighbor pixel analysis, allowing for dynamically-adjustable pixel thresholds to accurately delineate different material interfaces.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If existing contour line extraction frameworks are used, then the process is simple and fast, but the accuracy is insufficient and sub-pixel inaccuracies occur

Engineering Contradiction:
Improvecontour line extraction accuracyVSAvoidextraction process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the contour extraction process into multiple stages: initial contour detection, barrier line subdivision, and path-based refinement. Each stage processes specific aspects of the contour data independently, allowing for improved precision through detailed analysis of individual contour segments while maintaining overall process manageability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a new dimensional approach by transforming 2D contour lines into 1D barrier lines through systematic subdivision. This dimensional reduction allows for more precise manipulation and analysis of contour features at the pixel level, enabling sub-pixel accuracy through path-based refinement algorithms.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Loss of information

If existing contour line extraction frameworks are used, then the processing is quick, but information loss occurs and material interfaces are not differentiated

Engineering Contradiction:
Improvematerial interface differentiationVSAvoidprocessing speed
Core Design Contradiction:
Loss of informationVSProductivity

Solution Approach 1:

The patent divides the contour line into multiple barrier lines based on material interface detection. Each barrier line represents a distinct material interface and can be processed independently to preserve unique material characteristics. This segmentation prevents information loss by maintaining distinct representations of different materials throughout the analysis process.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality analysis by examining pixel characteristics at different locations along the contour line to identify material interfaces. Each segment of the contour is analyzed with attention to local pixel properties such as intensity gradients and color variations, enabling accurate differentiation of material interfaces while maintaining processing efficiency through targeted analysis.

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If contour lines are extracted without subdivision, then the process is simple, but sub-pixel inaccuracies and loss of information occur

Engineering Contradiction:
Improvecontour line precisionVSAvoidcontour processing complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent segments the contour line into multiple barrier lines through systematic subdivision based on material interface detection. Each barrier line is a refined segment that can be processed independently with appropriate precision algorithms, achieving manufacturing precision while managing complexity through modular processing.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements dynamic processing by adjusting the level of contour subdivision based on the specific characteristics of the image and material interfaces detected. The number and positioning of barrier lines are dynamically determined through path-based refinement algorithms that adapt to local image features, optimizing precision for each specific case without applying unnecessary complexity to simple structures.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS20260024302A1Path-based contour extraction for metrology
Publication Date: 2026.01.22 FEI CO
  • US20260024302A1 patent drawing
  • US20260024302A1 patent drawing
  • US20260024302A1 patent drawing

AI summary

Embodiments described herein relate to a process for image contour line extraction. A system can comprise a memory that stores, and a processor that executes, computer executable components. The computer executable components can comprise an identifying component that identifies a contour line applied between regions of a pixelated image, and a subdividing component that subdivides the contour line into a set of barrier lines based on a parsing of contour line pixels of the contour line. In one or more embodiments, the parsing can be based on a quantity of neighbor pixels that are contiguous with the contour line pixels.