Production Path Quality Analysis for Defective Device Order Detection

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Solution Overview

Problem

Existing methods cannot identify sequential orders of multiple devices that produce defective products in a production line, especially when there is a negative interaction between devices, leading to defective products due to combinations of drilling and screwing processes.

Innovation Solution

An apparatus comprising a production path extractor, quality generator, path pattern generator, association relationship generator, and defective path pattern identifier to analyze production paths and identify sequential orders of devices that produce defective products by estimating path pattern quality based on association relationships and production path quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a method identifies only single defective devices in a production line, then the identification process is simple, but it cannot identify path patterns of multiple devices that produce defective products

Engineering Contradiction:
Improveidentification processVSAvoiddefective product identification accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent segments the production path into multiple device nodes and analyzes each node's contribution to product quality. By dividing the production path into discrete segments (individual devices) and evaluating their combined effect, the system can identify not just single defective devices but also problematic combinations of devices in sequence, thereby resolving the contradiction between simple identification processes and accurate defective product identification.

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If the production line allows flexible combination of devices for different processes, then the production flexibility is improved, but negative interactions between devices may produce defective products

Engineering Contradiction:
Improveproduction flexibilityVSAvoidproduct quality consistency
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent implements a feedback mechanism where product quality data is collected and traced back through the production path to identify which device combinations resulted in defective products. This feedback loop allows the system to learn from past defects and adjust device assignments or combinations to prevent recurrence, thereby maintaining production flexibility while improving product quality consistency by avoiding problematic device sequences.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS11215975B2Apparatus, method and computer program for identifying defective devices
Publication Date: 2022.01.04 MITSUBISHI ELECTRIC CORP
  • US11215975B2 patent drawing
  • US11215975B2 patent drawing
  • US11215975B2 patent drawing

AI summary

An apparatus for identifying a path pattern of devices that produces a defective product in a production line where a product is produced via a plurality of device is provided. The device is configured to estimate a path pattern quality indicating a quality of a group of products produced through a production path included in a path pattern, based on a production path quality and an association relationship between a path pattern and a production path indicating devices via which the product is produced and an order of passing through the devices; and to identify a path pattern suspected to be defective based on the estimated path pattern quality.