Pattern-Based Timing Database for IC Aging Mitigation
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Solution Overview
Problem
Integrated circuit performance degradation due to device aging, such as negative bias temperature instability (NBTI), hot carrier injection (HCI), and time-dependent dielectric breakdown (TDDB), leads to over-constrained designs with excessive timing margins, penalizing performance, power, and area, especially in advanced technology nodes.
Innovation Solution
A pattern-based timing database is created to account for circuit usage profiles and topologies, optimizing timing margins by considering static probability and pin sensitivity, allowing for more realistic delay calculations and reduced pessimistic assumptions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional timing analysis methods are used with fixed timing margins to account for aging effects, then reliability is improved, but circuit performance deteriorates due to excessive timing margins
Solution Approach 1:
The patent applies local quality by differentiating timing margin requirements across different circuit locations and usage patterns. Instead of applying a uniform timing margin to all circuits, the method calculates location-specific timing margins based on actual circuit usage profiles, pin sensitivity, and aging patterns. This allows critical areas to have larger margins while non-critical areas use smaller margins, optimizing both reliability and performance.
Solution Approach 2:
The patent changes the parameter of timing margin from a fixed value to a dynamic value that varies based on circuit usage patterns and aging conditions. By introducing usage profile-based timing margins that adapt to different operating conditions and aging effects, the system optimizes the balance between reliability and performance rather than using conservative fixed margins for all cases.
2Reliability
If conservative timing margins are applied to all circuit cells to mitigate aging effects, then reliability is improved, but area overhead increases due to excessive design constraints
Solution Approach 1:
The patent reduces area overhead by applying local quality principles to timing margin allocation. Different circuit cells receive different timing margins based on their specific aging susceptibility and usage patterns rather than applying a uniform conservative margin to all cells. This selective approach minimizes the total area overhead while maintaining reliability where it is most needed.
Solution Approach 2:
The patent applies partial action by providing timing margin protection only where and when it is actually needed based on usage profiles and aging patterns. Instead of applying excessive timing margins universally, the method provides partial protection targeted at specific high-risk circuit elements, reducing overall area overhead while maintaining reliability for critical components.
3Ease of manufacture
If uniform timing margins are used across all circuit cells, then ease of manufacture is improved, but manufacturing precision deteriorates due to ignoring circuit-specific aging patterns
Solution Approach 1:
The patent improves manufacturing precision by applying local quality to timing analysis. Instead of using uniform timing margins for all circuit cells, the method calculates cell-specific timing margins based on individual circuit usage patterns, pin sensitivities, and aging characteristics. This produces more accurate timing predictions for each specific circuit configuration.
Solution Approach 2:
The patent uses copying by creating usage profile templates that capture recurring circuit behavior patterns. These templates are then applied to multiple similar circuit cells, allowing the system to achieve precise, customized timing analysis without manually analyzing each cell individually. This maintains ease of manufacture through template reuse while achieving manufacturing precision through customized analysis.
Data Source
AI summary
A method for manufacturing an integrated circuit includes determining a static probability pattern of a circuit cell in a timing path of the integrated circuit; determining a timing delay of the circuit cell along the timing path according to the static probability pattern and a pattern based timing database, wherein the pattern based timing database indicates a plurality of reference delays of each timing arc of the circuit cell characterized in response to a plurality of input stress patterns respectively; and manufacturing the integrated circuit according to the timing delay of the circuit cell along the timing path.