Pattern-Based Optical Lens Testing Apparatus

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Solution Overview

Problem

Conventional fiber optic connectors face manufacturing costs due to tight tolerances required for proper alignment, leading to deviations in optical signal transmission paths and inefficient lens alignment testing.

Innovation Solution

A pattern method for testing optical lenses using a first lens surface with a focal plane in object space and a second lens surface with a focal plane in image space, combined with a pattern test fixture and imaging device to compare viewed image representations with target patterns, facilitating efficient alignment assessment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If tight tolerances are used for connector alignment, then optical signal transmission quality is improved, but manufacturing cost increases

Engineering Contradiction:
Improveoptical signal transmission qualityVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent implements preliminary alignment testing using a pattern-based optical test method before final connector assembly. The test fixture positions a target pattern at a specific distance from the lens, allowing alignment verification to be performed in advance, which prevents the need for expensive post-assembly adjustments and reduces manufacturing costs while maintaining transmission quality

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If conventional sharpness tests are used for lens alignment, then measurement accuracy is improved, but device complexity and testing time increase

Engineering Contradiction:
Improvelens alignment measurement accuracyVSAvoidtesting device complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent uses a target pattern with specific geometric features (lines, spaces, or shapes) that creates a simplified optical copy for comparison. The test fixture captures an optical image of this pattern through the lens under test and compares it to a reference pattern, providing accurate alignment measurement without requiring complex sharpness test equipment or procedures

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent changes the test parameter from conventional sharpness measurement to pattern geometry comparison. By measuring the positional relationship between pattern features (such as line positions, space widths, or shape orientations) rather than focusing on sharpness, the system achieves accurate alignment measurement with simpler, faster testing

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method allows for easy and effective testing of lens alignment, reducing manufacturing costs and improving the quality of optical signal transmission by ensuring precise alignment without the need for complex sharpness tests.

Implementation Method 1

A pattern method for testing optical lenses using a first lens surface with a focal plane in object space and a second lens surface with a focal plane in image space, combined with a pattern test fixture and imaging device to compare viewed image representations with target patterns

Methodology Applied
Scientific EffectLight: Light

Data Source

PatentUS8766165B1Pattern-based optical lens testing apparatus having a module comparing a viewed image representation to a copy of target pattern and method for using the same
Publication Date: 2014.07.01 MACOM CONNECTIVITY SOLUTIONS LLC
  • US8766165B1 patent drawing
  • US8766165B1 patent drawing
  • US8766165B1 patent drawing

AI summary

A pattern method is provided for testing an optical lens. The method provides a lens for test, including a first lens surface with a focal plane in object space and a second lens surface with a focal plane in image space. Also provided is a pattern test fixture including an imaging device and a target pattern. The lens is positioned so that the imaging device is located outside the object space focal plane and the target pattern located is outside the image space focal plane. The imaging device, such as a microscope, magnification device, human eye, or camera, is used to view the target pattern. A viewed image representation of the target pattern is received in the imaging device and compared to the target pattern. More typically, the viewed image representation is compared to a target pattern copy.