Patterned Bit Error Measurement Apparatus for Storage Media
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Solution Overview
Problem
Data storage devices like HDDs and hybrid drives suffer from bit errors due to noise and interference, which impact performance, as existing methods fail to accurately determine bit errors and corresponding error rates from varying data patterns.
Innovation Solution
The implementation of a method that detects different data patterns in read data from storage media, calculates bit errors within these patterns, and determines bits in error (BIE) and bit error rates (BER) using pattern-dependent calculations, employing decoding circuitry with BIE calculation circuitry to identify and sum errors across various bit configurations and frequencies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional bit error measurement methods are used, then the measurement process is simple, but the measurement precision is insufficient due to inability to account for pattern-dependent errors
Solution Approach 1:
The patent segments the bit error measurement process into multiple stages: pattern detection stage, pattern classification stage, and pattern-dependent error calculation stage. The BIE calculation circuitry is divided into sub-circuits that handle different pattern types separately, allowing precise measurement while organizing complexity into manageable modular components
Solution Approach 2:
The patent applies local quality by using different error calculation methods for different data patterns. Instead of a uniform measurement approach, the system identifies specific patterns (such as PRML patterns, EFM patterns) and applies tailored error measurement techniques to each pattern type, thereby achieving higher overall measurement precision
2Reliability
If pattern-dependent error calculations are implemented, then the reliability of error measurement is improved, but the device complexity increases due to additional circuitry and processing steps
Solution Approach 1:
The patent implements preliminary action by pre-classifying data patterns into distinct categories before error calculation. The pattern detection and classification circuitry identifies and tags different pattern types in advance, so that the subsequent BIE calculation can efficiently apply the appropriate error measurement method without complex real-time decision-making, thereby improving reliability while managing complexity
Solution Approach 2:
The patent introduces intermediary components including pattern detection circuitry and pattern classification circuitry that act as mediators between the raw data input and the error calculation process. These intermediaries organize and prepare the data in a structured format, making the overall system more reliable while distributing complexity across specialized functional blocks
3Measurement precision
If bit errors are determined for different data patterns separately, then the measurement precision is improved, but the processing time increases
Solution Approach 1:
The patent applies periodic action by organizing the separate error calculations for different patterns into a systematic periodic process. The BIE calculation circuitry cycles through different pattern types in a predetermined sequence, applying the appropriate error measurement method to each pattern class. This structured periodic approach maintains high measurement precision while optimizing processing throughput by avoiding random or redundant calculations
Data Source
AI summary
A method includes detecting different data patterns in data read from a portion of a non-transitory data storage medium. Bit errors in the different data patterns are then determined. Further, bits in error for a total number of bits in each of the different data patterns are calculated from the determined bit errors in the different data patterns.