Patterned Light Illumination for Atmospheric Particle Detection

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Solution Overview

Problem

Existing time-of-flight camera systems face challenges in effectively illuminating scenes, particularly in the presence of atmospheric aerosol and precipitation particles, which can deteriorate the performance of these systems.

Innovation Solution

The proposed imaging system uses patterned light to illuminate scenes, allowing for the determination of bright and dark regions in the image data. This system relates image information from bright regions to dark regions to characterize atmospheric aerosol particles and compares first and second image data sets to determine characteristics of atmospheric precipitation particles.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional illumination techniques are used in time-of-flight cameras, then the system can operate with standard lighting, but the detection precision of atmospheric particles deteriorates

Engineering Contradiction:
Improveparticle detection precisionVSAvoidillumination system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The illumination is segmented into multiple patterns (e.g., alternating bright and dark stripes) that are projected onto the scene. This segmentation allows different regions to provide complementary information for particle detection, improving measurement precision while using a relatively simple projection mechanism

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The illumination pattern is modulated periodically over time, with different phases applied in successive frames. This periodic modulation enables the extraction of particle characteristics through temporal analysis of the modulated reflected light, enhancing detection precision without requiring complex continuous illumination systems

Inventive Principle:
Principle #19Periodic action

2Measurement precision

If patterned light is used to improve particle detection, then measurement precision improves, but the device complexity increases

Engineering Contradiction:
Improveaerosol and precipitation particle detection precisionVSAvoidpatterned illumination system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patterned illumination system serves multiple functions: it provides standard illumination for general imaging while simultaneously encoding spatial patterns that enable particle detection. The same modulated light source is used for both depth measurement and aerosol/precipitation particle characterization, reducing overall system complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system uses the reflected patterned light from the scene itself to detect particles, rather than requiring separate detection hardware. The scene's reflection of the modulated pattern provides the necessary information for particle characterization, allowing the illumination system to serve its own detection needs

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The use of patterned light enhances the ability to detect and characterize atmospheric aerosol and precipitation particles, improving the performance of time-of-flight camera systems by providing better illumination techniques and enabling more accurate determination of particle characteristics.

Implementation Method 1

an illuminator that illuminates a region of interest with modulated light

Methodology Applied
Scientific EffectLight emission: Light

Implementation Method 2

a pixel array that collects light reflected from the same region of interest

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS12298405B2Imaging systems, devices and methods
Publication Date: 2025.05.13 SONY SEMICON SOLUTIONS CORP
  • US12298405B2 patent drawing
  • US12298405B2 patent drawing
  • US12298405B2 patent drawing

AI summary

An imaging system comprising circuitry configured to obtain (S2) image data of a scene that is illuminated with patterned light (PL), determine (S5, S6) bright regions and dark regions based on the image data, and relate image information related to the bright regions to image information related to the dark regions in order to determine characteristics of atmospheric aerosol particles (AP).