Patterned Structure for Reducing Petal Flares in Solid-State Image Sensors
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Solution Overview
Problem
Solid-state image sensors face challenges with grating diffraction issues due to partition grids, leading to color dispersion and ghost images, which affect the quality of the image signal.
Innovation Solution
A patterned structure with patterned segments is introduced on the color filter layer, surrounded by a transparent layer, where the refractive index of the patterned segments is lower than the transparent layer, preventing diffraction and improving image quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a partition grid is used to separate color filter layers, then color separation is achieved, but grating diffraction occurs causing color dispersion and ghost images
Solution Approach 1:
The patent applies local quality by introducing a patterned structure with varying refractive indices at specific locations on the color filter layer. The patterned structure has different refractive index regions (first refractive index and second refractive index) that are locally positioned to modify light propagation paths, thereby reducing grating diffraction effects while maintaining color separation functionality in the partition grid regions.
Solution Approach 2:
The patent utilizes parameter changes by varying the refractive index parameter in the patterned structure. The patterned structure includes regions with different refractive indices (first refractive index different from second refractive index), which changes the optical parameters to reduce diffraction effects. This parameter variation allows control over light bending and reduces the harmful diffraction patterns caused by the partition grid.
2Object-affected harmful factors
If the patterned structure with lower refractive index is introduced, then diffraction is reduced, but device complexity increases
Solution Approach 1:
The patent introduces a patterned structure as an intermediary element between the partition grid and the color filter segments. This patterned structure acts as a mediator that modifies light paths and reduces diffraction effects without requiring fundamental changes to the existing partition grid or color filter architecture. The intermediary patterned structure with its varying refractive indices provides a practical solution that balances performance improvement with acceptable device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively reduces diffraction from partition grids, enhancing the quality of the image signal from photoelectric conversion elements in solid-state image sensors.
Implementation Method 1
it is easy to have grating diffraction issues owing to the same partition grid periods, which may cause the obtained image to have color dispersion (petal flares) and ghost images
Implementation Method 2
The refractive index of the patterned structure is lower than the refractive index of the transparent layer
Data Source
AI summary
A solid-state image sensor is provided. The solid-state image sensor includes a plurality of photoelectric conversion elements. The solid-state image sensor also includes a color filter layer disposed above the photoelectric conversion elements. The color filter layer has a plurality of color filter segments. The solid-state image sensor further includes a partition grid disposed between the color filter segments. Moreover, the solid-state image sensor includes a patterned structure disposed on the color filter layer. The patterned structure has a plurality of patterned segments. The solid-state image sensor also includes a transparent layer disposed on the color filter layer and the partition grid. The transparent layer surrounds the patterned segments. At least one patterned segment is disposed on the partition grid.