3D Powder Bed Fusion Control Using Multi-Expression Electron Signals

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Solution Overview

Problem

Conventional three-dimensional powder bed fusion additive manufacturing (PBF-AM) technologies face limitations in determination accuracy due to the use of a single arithmetic expression for processing backscattered electron signals, leading to reduced image recognition and determination processing capabilities.

Innovation Solution

A three-dimensional PBF-AM apparatus equipped with multiple detection units and a control unit that selects and applies various arithmetic expressions for processing backscattered electron signals, enhancing determination accuracy and expanding the use of these signals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a single arithmetic expression is used to process backscattered electron signals, then the processing is simple, but the determination accuracy and image recognition capability are reduced

Engineering Contradiction:
Improvedetermination accuracyVSAvoidprocessing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent divides the backscattered electron signal processing into multiple independent arithmetic expressions, each targeting specific determination factors such as unevenness, contours, and other build quality parameters. This segmentation allows each expression to specialize in extracting particular features, thereby improving overall determination accuracy while maintaining manageable complexity through modular processing.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from single-dimension signal processing to multi-dimensional analysis by applying multiple arithmetic expressions simultaneously. Each expression operates on the backscattered electron signals from different detection units to extract various determination factors, effectively adding analytical dimensions and enabling comprehensive build quality assessment.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Loss of information

If multiple detection units are used to detect backscattered electrons, then more signals are obtained, but the complexity of arithmetic processing increases

Engineering Contradiction:
Improvesignal information completenessVSAvoidprocessing complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The patent assigns specific arithmetic expressions to process signals from different detection units based on their spatial positions. Each detection unit's signals are processed by dedicated expressions tailored to extract specific determination factors, which segment the complex multi-source signal processing into manageable, specialized tasks and reduce overall processing complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates a universal processing framework where multiple arithmetic expressions work together to handle signals from multiple detection units. Each expression is designed to be applicable across different detection units for specific determination factors, enabling reusable, multi-functional processing that reduces complexity compared to custom-processing approaches.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Adaptability or versatility

If only one kind of backscattered electron image is obtained, then the processing is straightforward, but the determination processing capability is limited

Engineering Contradiction:
Improvedetermination processing capabilityVSAvoidprocessing complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent segments the backscattered electron image generation into multiple specialized arithmetic expressions, each producing images optimized for specific determination factors such as unevenness detection, contour analysis, and other build quality assessments. This segmentation enables versatile determination processing for different build parameters while keeping each individual processing task relatively simple.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent adds analytical dimensions by generating multiple kinds of backscattered electron images simultaneously through different arithmetic expressions. Each image type provides a different perspective or emphasis on build quality features, enabling comprehensive multi-faceted determination processing that goes beyond single-image analysis.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Improves determination accuracy during the build process by generating multiple backscattered electron images, allowing for more precise assessment of powder spreading and melting conditions, thereby expanding the application of backscattered electron signals in PBF-AM.

Implementation Method 1

backscattered electrons generated when an electron beam is applied to a powder material

Methodology Applied
Scientific EffectBackscattered electron generation: Electron Impact Desorption

Data Source

PatentUS20240335885A1Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Method for Controlling Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
Publication Date: 2024.10.10 JEOL LTD
  • US20240335885A1 patent drawing
  • US20240335885A1 patent drawing
  • US20240335885A1 patent drawing

AI summary

A three-dimensional PBF-AM apparatus includes a build plate, a powder supply device, a beam irradiation device, a plurality of detection units, and a control unit. The control unit has a plurality of arithmetic expressions. Then, the control unit selects, according to a build step, a predetermined arithmetic expression from the plurality of arithmetic expressions, uses the selected arithmetic expression to perform arithmetic processing on a plurality of backscattered electron signals, and calculates an arithmetic signal.