Embedded Bridge PCB Structure for Die-to-Die Thermal Stability

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Solution Overview

Problem

The use of silicon-based interposers for die-to-die electrical connections is costly and prone to reliability issues due to thermal expansion mismatch and complex manufacturing processes, and silicon interposers are difficult to form with through silicon vias.

Innovation Solution

A printed circuit board with a wiring substrate that includes insulating and wiring layers, embedding a bridge with large connection pads and a pitch, allowing for die-to-die interconnection, which can be manufactured using a PCB process, reducing manufacturing complexity and cost, and minimizing thermal expansion mismatch.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a silicon-based interposer is used for die-to-die connection, then electrical connection between dies is achieved, but manufacturing cost and process complexity increase significantly

Engineering Contradiction:
Improveelectrical connection reliabilityVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent changes the material parameter from silicon to organic substrate material, and changes the interconnection structure parameter from TSV to embedded bridge with through-substrate vias. This parameter change resolves the contradiction by achieving electrical connection reliability through the embedded bridge structure while avoiding the complex TSV manufacturing process associated with silicon interposers.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces expensive silicon interposer material with cheaper organic substrate material. The embedded bridge structure using standard PCB materials and processes provides a cost-effective alternative to silicon-based solutions, achieving the same electrical interconnection function at lower material and manufacturing cost.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

2Reliability

If a silicon-based interposer is used, then die-to-die electrical connection is enabled, but material cost and manufacturing cost increase

Engineering Contradiction:
Improveelectrical connection reliabilityVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent replaces expensive silicon interposer material with cheaper organic substrate material. The embedded bridge structure using standard PCB materials and processes provides a cost-effective alternative to silicon-based solutions, achieving the same electrical interconnection function at lower material and manufacturing cost.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent substitutes the mechanical TSV formation process in silicon with a PCB-compatible embedded bridge structure. This substitution enables manufacturing using standard PCB processes such as lamination and via formation, eliminating the need for complex semiconductor fabrication processes and significantly reducing manufacturing cost.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Reliability

If a silicon-based interconnect bridge is used, then die-to-die connection is achieved, but reliability issues arise due to CTE mismatch

Engineering Contradiction:
Improveelectrical connection reliabilityVSAvoidthermal expansion stability
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The patent uses organic substrate material for the bridge structure that is homogeneous with the surrounding substrate material. This homogeneity ensures matched coefficients of thermal expansion (CTE) between the bridge and substrate, eliminating the CTE mismatch problem that causes reliability issues in silicon-based interconnect bridges during thermal cycling.

Inventive Principle:
Principle #33Homogeneity

4Reliability

If through silicon via (TSV) is formed in silicon interposer, then vertical electrical connection is achieved, but manufacturing complexity increases

Engineering Contradiction:
Improvevertical electrical connectionVSAvoidTSV formation process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent substitutes the mechanical TSV formation process in silicon with a PCB-compatible embedded bridge structure. This substitution enables manufacturing using standard PCB processes such as lamination and via formation, eliminating the need for complex semiconductor fabrication processes and significantly reducing manufacturing complexity.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the interconnection structure parameter from TSV to embedded bridge with through-substrate vias. This parameter change resolves the contradiction by achieving vertical electrical connection reliability through the embedded bridge structure while avoiding the complex TSV manufacturing process associated with silicon interposers.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS12484148B2Printed circuit board
Publication Date: 2025.11.25 SAMSUNG ELECTRO MECHANICS CO LTD
  • US12484148B2 patent drawing
  • US12484148B2 patent drawing
  • US12484148B2 patent drawing

AI summary

A printed circuit board includes: a wiring substrate including a plurality of insulating layers, a plurality of wiring layers, and a plurality of via layers; and a bridge embedded in the wiring substrate and having a plurality of connection pads thereon. An uppermost wiring layer of the plurality of wiring layers includes a plurality of bump pads connected to the plurality of connection pads, and a pitch between at least two adjacent connection pads of the plurality of connection pads is larger than a pitch between at least two adjacent ones of the plurality of bump pads.