PCB Test Fixture Shim Aperture RF Energy Routing

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Solution Overview

Problem

Troubleshooting and failure mode analysis of hybrid printed circuit boards (PCBs) used for RF signal propagation is challenging due to the difficulty in isolating integrated components, which often requires costly modifications and decreases functionality.

Innovation Solution

A test fixture is designed to test individual components of PCBs by using a shim with an aperture to direct RF energy to a top clamp, and a bottom clamp to retain the PCB, allowing for quick mounting and testing without modifying the PCB, enabling the isolation of components like MMICs and SIWs without destructive changes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If components are integrated into a single layer on hybrid PCBs, then signal-to-noise ratio and operational efficiency are improved, but troubleshooting and failure mode analysis become difficult due to inability to isolate components

Engineering Contradiction:
Improvesignal-to-noise ratioVSAvoidcomponent isolation difficulty
Core Design Contradiction:
ReliabilityVSDifficulty of detecting and measuring

Solution Approach 1:

The test fixture segments the integrated components by providing individual test ports and isolation structures that allow each component (MMICs, SIWs, microstrips, BGAs) to be tested separately despite being integrated on the same PCB layer. This enables failure mode analysis of individual components without physical separation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The test fixture acts as an intermediary between the integrated components and the testing equipment. It provides a standardized interface that couples to each component individually, allowing external test equipment to measure and analyze specific components without requiring physical access or modification to the integrated PCB structure.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Difficulty of detecting and measuring

If components are physically separated for testing, then component isolation is achieved, but PCB functionality decreases and costly modifications are required

Engineering Contradiction:
Improvecomponent isolation capabilityVSAvoidPCB modification cost
Core Design Contradiction:
Difficulty of detecting and measuringVSEase of manufacture

Solution Approach 1:

The test fixture extracts the testing function from the integrated PCB structure by providing external test ports and coupling mechanisms. This allows component-level testing to be performed without extracting or modifying the actual components from their integrated positions on the PCB.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The test fixture provides a universal testing platform that can test multiple different component types (MMICs, SIWs, microstrips, BGAs) on hybrid PCBs without requiring custom modifications for each component type. The standardized test ports and isolation structures make the fixture adaptable to various component configurations.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables effective testing of individual components without altering the PCB design, reducing costs and maintaining functionality, facilitating accurate diagnosis and characterization of RF signal issues.

Implementation Method 1

an aperture configured to direct RF energy from the component, via the end of the PCB, and to a top clamp of the test fixture

Methodology Applied
Scientific EffectRF energy propagation: Electromagnetic Induction

Implementation Method 2

a taper configured to direct the RF energy from the aperture of the shim and to the standard test port

Methodology Applied
Scientific EffectRF energy propagation: Electromagnetic Induction

Implementation Method 3

a bottom clamp configured to be attached to the top clamp to retain the PCB between the top clamp and the bottom clamp for testing

Methodology Applied
Scientific EffectMechanical retention: Mechanical Force

Data Source

PatentUS12153083B2Test fixture for printed circuit board components
Publication Date: 2024.11.26 APTIV TECHNOLOGIES AG
  • US12153083B2 patent drawing
  • US12153083B2 patent drawing
  • US12153083B2 patent drawing

AI summary

A test fixture for PCB components is described herein. The test fixture comprises a shim with an aperture configured to direct RF energy from a component of a PCB, via an end of the PCB, and to a top clamp of the test fixture. The end of the PCB may correspond to a cut line of a destructive test. The test fixture also comprises the top clamp with a test port and a taper configured to direct the RF energy from the aperture to the test port. The test fixture also comprises a bottom clamp attached to the top clamp to retain the PCB between the top and bottom clamps for testing. The test fixture allows for quick mounting of the PCB and testing of the component without modifying a design of the PCB or requiring specific drilling of the PCB.