PCB Trace Graph Tokenization for Signal Integrity Analysis
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Solution Overview
Problem
As the frequency range of substrate analysis increases and design complexity grows, existing methods require significantly more operations and time to analyze signal integrity on substrates.
Innovation Solution
An apparatus and method utilizing one or more processors to transform substrate traces into graphs, tokenize these graphs, generate representation vectors, and determine frequency characteristics based on these vectors, allowing for efficient prediction of scattering parameters of a 4-port network.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional substrate design programs are used to analyze signal integrity, then analysis accuracy is maintained, but analysis time increases significantly
Solution Approach 1:
The substrate trace is divided into multiple segments, and each segment is represented as a separate graph node with associated features. This segmentation allows the complex substrate structure to be broken down into manageable units that can be processed independently and then combined, reducing the overall computational burden while maintaining analysis accuracy.
Solution Approach 2:
The patent creates a graph-based representation (a simplified model) of the actual substrate trace. This graph copy contains the essential geometric and topological features needed for frequency characteristic analysis without requiring full-scale electromagnetic simulation of the physical substrate, thereby significantly reducing computation time while preserving measurement precision.
2Adaptability or versatility
If frequency range analysis is extended to higher frequencies (over 15 GHz), then analysis coverage is improved, but computational complexity increases
Solution Approach 1:
The patent extracts key parameters from substrate trace data (such as segment lengths, widths, spacing, and material properties) and uses these parameters to construct graph representations. By changing from full-wave electromagnetic simulation to graph-based frequency characteristic calculation using extracted parameters, the method achieves higher frequency analysis capability with reduced computational complexity.
Solution Approach 2:
The patent transforms the three-dimensional physical substrate structure into a two-dimensional graph representation with nodes and edges. This dimensional reduction simplifies the computational model while retaining the essential characteristics needed for frequency analysis, enabling extended frequency range coverage without proportional increases in computational complexity.
3Adaptability or versatility
If substrate design complexity increases, then design capability is improved, but number of operations required increases
Solution Approach 1:
The patent performs preliminary extraction of geometric features and construction of graph representations from substrate trace data before conducting frequency characteristic analysis. This preliminary processing organizes the complex design data into a structured format that facilitates faster subsequent analysis, thereby improving productivity without sacrificing design capability.
Data Source
AI summary
An apparatus and method for analyzing a frequency characteristics of a substrate are provided, through the steps of tokenizing a trace of a substrate into a graph, generating a representation vector from the tokens of the graph, and analyzing a frequency characteristics of the substrate based on the representation vector.