PCIe Loopback Test Card for Printed Circuit Assembly Connectivity Verification
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Solution Overview
Problem
Existing testing methods for PCIe connectors on printed circuit assemblies are time-consuming, particularly when using functional tests, which can significantly increase the time-to-market due to the high density of components and increased likelihood of defective connections.
Innovation Solution
A dedicated test card with electrical contacts and resistors is used in in-circuit testers to perform an optimized loopback test, providing full pin coverage and enabling quick detection of open or short circuits by forming loopback paths between adjacent pins.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If functional tests are used to test PCIe connectors on printed circuit assemblies, then comprehensive connectivity verification is achieved, but testing time significantly increases
Solution Approach 1:
The patent extracts the essential testing function from complex functional tests by implementing a dedicated test card with electrical contacts that directly interface with PCIe connector pins. This test card isolates the connectivity verification function from other functional tests, allowing rapid measurement of electrical continuity between pins without executing full functional test sequences, thus reducing testing time while maintaining verification comprehensiveness
Solution Approach 2:
The patent introduces a dedicated test card as an intermediary device between the test equipment and the PCIe connector. This test card contains electrical contacts and measurement circuitry that mediate the testing process, enabling direct electrical measurements of pin connectivity without requiring full system functional testing, thereby achieving fast yet comprehensive connectivity verification
2Productivity
If component density on printed circuit assemblies is increased, then product integration is improved, but the likelihood of defective connections increases
Solution Approach 1:
The patent implements preliminary testing of PCIe connector connections during the manufacturing process using a dedicated test card. By performing connectivity verification before final assembly and shipping, defective connections caused by high component density and soldering complexity can be detected and corrected early, preventing field failures while allowing continued use of high-density designs
Solution Approach 2:
The patent replaces complex mechanical and functional testing systems with a simplified electrical measurement system using the dedicated test card. This system substitutes lengthy functional test sequences with direct electrical continuity measurements, enabling rapid detection of connection defects in high-density assemblies without requiring complex test equipment or procedures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces testing time by allowing for rapid identification of defective pins, thereby accelerating the production process while ensuring comprehensive pin coverage and connectivity verification.
Implementation Method 1
The in-circuit tester is configured to measure resistance values of the plurality of resistors
Data Source
AI summary
An apparatus is provided for testing a PCIe interface on a printed circuit assembly. The apparatus can include a plurality of electrical contacts to couple to a PCIe interface of the printed circuit assembly, wherein a respective electrical contact corresponds to a pin of the PCIe interface. The apparatus can also include a plurality of resistors. Each resistor is coupled between two adjacent electrical contacts. At least one electrical contact corresponds to a ground, power, or not connected (NC) pin of the PCIe interface, thereby allowing a loopback test to determine connectivity between the pins of the PCIe interface and the printed circuit assembly.