PCIe Riser Card with FPGA for High-Speed Power Sampling
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Solution Overview
Problem
Current PCIe device testing systems lack the necessary granularity in power measurement and signal control, particularly when testing multiple devices simultaneously, as they are limited by processing capabilities and are not easily expandable to test other PCIe devices.
Innovation Solution
The iRiser, a PCIe riser card equipped with a dedicated ASIC or programmed FPGA, allows for precise control and measurement of 32 signals, including power and reset, at up to 1 million samples per second, and writes data directly to the host controller with zero overhead, enabling synchronized monitoring during specific test conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If existing FPGA board solutions are used to test multiple SSD drives simultaneously, then testing capability is improved, but measurement granularity is limited due to processing limitations
Solution Approach 1:
The system divides the testing function into two parts: a dedicated sampling device (FPGA/ASIC) that performs high-granularity power sampling at up to 1 million samples per second, and a host processor that coordinates test conditions. This segmentation allows the sampling device to capture precise power measurements independently of host processor performance, resolving the contradiction between multi-device testing capability and measurement granularity.
2Measurement precision
If dedicated ASIC or FPGA is used for signal control and power sampling, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The sampling device is designed with universal functionality to test any PCIe device type (SSD drives, network cards, graphics cards, etc.) through a standardized interface. The device can control multiple signals (power, reset, etc.) and measure power consumption across different device types, reducing the need for multiple specialized testing devices and justifying the increased complexity through broad applicability.
3Measurement precision
If high-speed sampling at 1 million samples per second is implemented, then measurement precision is improved, but processing overhead on host processor increases
Solution Approach 1:
The system extracts the high-speed sampling function from the host processor and implements it in a dedicated sampling device using FPGA or ASIC hardware. This extraction allows the sampling device to perform high-granularity measurements independently, transferring only essential test condition coordination to the host processor and eliminating the processing overhead that would result from software-based high-speed sampling.
4Productivity
If existing testing solutions are dedicated to SSD drives, then testing capability is improved for SSDs, but adaptability to other PCIe devices is reduced
Solution Approach 1:
The sampling device implements a universal PCIe interface and standardized control mechanism that can accommodate any PCIe device type. The system uses generic signal names (power, reset) and a standardized test condition coordination protocol, allowing the same hardware to test SSD drives, network cards, graphics cards, and other PCIe devices without requiring device-specific customization, thereby achieving both SSD testing capability and broad adaptability.
Data Source
AI summary
A solution is the iRiser. The iRiser is a PCIe riser, designed to work with SANBlaze test systems but capable of operation in any PCIe slot on any computer. The iRiser includes a dedicated ASIC or programmed FPGA that cycles any of 32 signals, including power and reset, and samples power at up to 1 million samples per second, to any connected PCIe devices (such as sixteen NVMe drives under test in a SANBlaze test system, or more if larger testing systems are used). This allows precise insertion of any signal, including power and reset, at any desired testing point, and precise measurement of power drawn during any test condition, including transitions such as power on/off, reset, and low power state returning to running state. The iRiser can write measurement data to a host controller through direct memory access, providing the data synchronized to precise test conditions with zero overhead.