PCIE Switch Production Line Test Automation
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Solution Overview
Problem
The existing methods for detecting PCIE Switch products in production lines are inefficient, requiring repeated assembly and connection to servers and devices to check the state, bandwidth, and rate, which significantly affects detection efficiency.
Innovation Solution
A method that involves connecting PCIE Switch product ports via cables according to a preset rule, controlling a pre-stored configuration file to operate the product in a detection state, and acquiring current operation information to determine if it meets preset conditions, allowing for efficient detection without repeated assembly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the PCIE Switch product is assembled and connected to the server and PCIE device to check state, bandwidth and rate, then the detection accuracy is improved, but the detection efficiency deteriorates due to repeated assembly requirements
Solution Approach 1:
The patent applies preliminary action by pre-configuring the detection environment before actual product testing. Specifically, the server and PCIE device are pre-assembled and connected in advance, creating a ready-to-use detection platform. When a PCIE Switch product needs testing, it is simply plugged into the pre-prepared detection interface, eliminating the need for repeated assembly operations while maintaining comprehensive detection capabilities for state, bandwidth, and rate parameters
Solution Approach 2:
The patent introduces an intermediary detection interface that mediates between the PCIE Switch product and the detection system. This standardized interface allows the product to be quickly connected and disconnected without requiring full assembly or disassembly of the entire system. The intermediary interface maintains the necessary electrical and logical connections while enabling rapid product exchange, thus improving detection efficiency without compromising detection accuracy
2Reliability
If the PCIE Switch product is reassembled for each detection requirement change, then the detection comprehensiveness is improved, but the time consumption increases significantly
Solution Approach 1:
The patent applies segmentation by separating the detection system into independent modular components: the server platform, the PCIE device, and the PCIE Switch product under test. Each component can be independently configured and tested. The detection requirements are also segmented into different test cases (state detection, bandwidth detection, rate detection) that can be executed independently on the same physical platform without requiring reassembly, thus reducing time consumption while maintaining comprehensive detection coverage
Solution Approach 2:
The patent creates a universal detection platform that can handle multiple detection requirements through software configuration rather than physical reassembly. The same hardware platform serves multiple detection functions (state, bandwidth, rate detection) by loading different detection programs or configuration files. This multi-functionality allows the system to adapt to changing detection requirements without time-consuming reassembly operations
Data Source
AI summary
A production line test method, system and device for a PCIE Switch product, and a medium. The method comprises: connecting to ports of a target PCIT Switch product using cables according to a preset rule, and controlling a target configuration file to run using a target controller such that the target PCIE Switch product enters a test state, wherein the target configuration file is a file pre-stored in the target PCIE Switch product, and the target controller is a controller pre-connected to the target PCIE Switch product; reading the current running information of the target PCIE Switch product and determining whether the current running information satisfies a preset condition; and if yes, determining that a production line of the target PCIE Switch product is normal. Hence, the method can greatly improve the test efficiency of a production line of a target PCIE Switch product.