PCIe-to-USB Test Adapter for Hot-Plug SSD Parallel Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Solid-state drives with PCIe interfaces do not support hot-plugging and parallel testing, complicating production line testing and reducing efficiency due to limited transmission bandwidths.
Innovation Solution
A test adapter device with a USB hub module, PCIe slots, interface adapter modules, switch modules, and a control switch module that enables hot-plugging and parallel testing by converting PCIe signals to USB signals, allowing flexible resource allocation and precise control of lane groups.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If PCIe interfaces are used for solid-state drives, then transmission bandwidth is improved, but hot-plugging capability deteriorates
Solution Approach 1:
The patent introduces a test adapter device as an intermediary between the host system and PCIe solid-state drives. This adapter includes PCIe slots for connecting storage devices, interface adapter modules for signal conversion, and USB interfaces for host communication. The adapter enables hot-plugging of PCIe drives by mediating the connection through USB interfaces that support hot-plugging, thus resolving the contradiction between maintaining high PCIe bandwidth and enabling hot-plugging capability.
2Productivity
If multiple storage devices are tested in parallel, then test efficiency is improved, but transmission bandwidth limitation worsens
Solution Approach 1:
The patent segments the PCIe interface into multiple lane groups, where each lane group can be independently controlled and allocated to different storage devices. The interface adapter modules convert signals from different lane groups to USB interfaces, allowing multiple storage devices to be tested in parallel through USB connections. This segmentation enables parallel testing while managing bandwidth limitations by distributing traffic across multiple independent channels.
Solution Approach 2:
The patent implements dynamic lane group allocation where the host system can flexibly assign different lane groups to different storage devices based on testing requirements. The switch modules dynamically control the connection between lane groups and interface adapter modules, enabling adaptive resource allocation that optimizes bandwidth utilization for parallel testing scenarios.
3Adaptability or versatility
If lane groups are flexibly allocated, then resource utilization is improved, but device complexity worsens
Solution Approach 1:
The control switch module is designed with multi-functionality to manage multiple lane groups and interface adapter modules through a unified control interface. It can allocate lane groups to different storage devices, control switch module states, and manage power supply states of interface adapter modules all through a single module. This universal design reduces overall system complexity despite the flexible resource allocation capabilities.
Data Source
AI summary
A test adapter device includes: a USB hub module having multiple USB interfaces; multiple PCIe slots, each including multiple lanes grouped into lane groups; multiple interface adapter modules, each connected to one lane group of one PCIe slot and one USB interface for signal conversion; multiple switch modules to control a power supply state of the corresponding interface adapter module; and the control switch module connected to a host system and the switch module, controlling a state of the switch module according to a received test instruction, thereby selectively controlling power supply of the interface adapter module.