Pellicle Capillary Design for Adhesive Residue Removal

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Solution Overview

Problem

Existing techniques for fabricating mask-pellicle systems in the semiconductor industry are not entirely satisfactory due to deficiencies in the pellicle structure and materials used, leading to adhesive residue on the mask after demounting, which requires manual cleaning and risks causing defects.

Innovation Solution

The proposed solution involves a pellicle design with a patterned pellicle frame that includes capillaries of varying depth, which facilitates the removal of adhesive residue during demounting by allowing the adhesive to flow into the capillaries, reducing the need for manual cleaning and minimizing the risk of defects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a pellicle is used to protect the mask, then particle protection is improved, but adhesive residue remains on the mask after demounting

Engineering Contradiction:
Improveparticle protectionVSAvoidadhesive residue
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The pellicle frame is designed with different surface properties in different regions: a first surface with a first set of capillaries for adhesive capture, and a second surface with a second set of capillaries for adhesive capture. This local differentiation allows the pellicle to protect the mask while providing targeted adhesive removal capabilities at specific locations.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The pellicle frame incorporates capillaries (porous structures) that allow adhesive material to penetrate and be captured within the frame structure. The capillaries act as porous channels that absorb and hold adhesive residue, preventing it from remaining on the mask surface during demounting.

Inventive Principle:
Principle #31Porous materials

2Object-generated harmful factors

If manual cleaning is performed to remove adhesive residue, then adhesive removal is improved, but the risk of causing defects increases

Engineering Contradiction:
Improveadhesive residue removalVSAvoiddefect risk
Core Design Contradiction:
Object-generated harmful factorsVSReliability

Solution Approach 1:

The pellicle frame is designed to automatically capture and hold adhesive residue through its capillary structures during the demounting process. The adhesive is drawn into the capillaries by capillary action, eliminating the need for manual cleaning operations and preventing defects that would result from manual intervention near critical pattern areas.

Inventive Principle:
Principle #25Self-service

3Ease of manufacture

If the pellicle structure is simplified, then manufacturing is improved, but adhesive removal capability deteriorates

Engineering Contradiction:
Improvepellicle fabricationVSAvoidadhesive residue
Core Design Contradiction:
Ease of manufactureVSObject-generated harmful factors

Solution Approach 1:

The pellicle frame is segmented into multiple functional regions with different capillary configurations. The first surface has a first set of capillaries while the second surface has a second set, allowing each region to be optimized for specific adhesive capture functions while maintaining an otherwise simple pellicle structure that can be manufactured using standard techniques.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution effectively reduces the risk of adhesive residue causing defects during the demounting process, improving the efficiency and reliability of the mask-pellicle system by allowing for easier and more controlled adhesive removal.

Implementation Method 1

a pattern formed in the pellicle frame, wherein the pattern includes capillaries of varying depth

Methodology Applied
Scientific EffectCapillary action: Capillary Action

Data Source

PatentUS12253797B2Pellicle design for mask application
Publication Date: 2025.03.18 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12253797B2 patent drawing
  • US12253797B2 patent drawing
  • US12253797B2 patent drawing

AI summary

The present disclosure provides an apparatus for a semiconductor lithography process. The apparatus includes a mask defining a circuit pattern to be transferred. The apparatus further includes a pellicle including a pattern formed in a first surface, wherein the pellicle is attached to the mask at the first surface. The apparatus also includes an adhesive material layer disposed between the mask and the first surface. The pattern may include a plurality of capillaries. Each capillary of the plurality of capillaries may have a dimension in a plane of the first surface between about 1 μm and about 500 μm. Each capillary of the plurality of capillaries may have a ratio of depth to width greater than or equal to about 100. The adhesive material layer may include an adhesive having a glass transition temperature (Tg) greater than room temperature.