Perovskite Detection Layer for X-Ray Imaging

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Solution Overview

Problem

Current X-ray detectors face challenges with organic semiconductors, which have limited conductivity and efficiency in thick layers, restricting their use in medical imaging due to impeded charge carrier extraction and reduced speed, especially for applications requiring high sensitivity and speed like mammography.

Innovation Solution

The development of a detection layer using perovskite crystals with a thickness of at least 10 μm, coated scintillator particles, and a sintering process to create a homogeneous, conductive layer that absorbs X-ray radiation effectively, enhancing conductivity and mobility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If organic semiconductors are used in thick layers for X-ray detection, then the sensitivity and radiation absorption are improved, but the conductivity and charge carrier extraction are deteriorated

Engineering Contradiction:
Improvelayer thicknessVSAvoidconductivity
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent uses a composite material system combining organic semiconductor matrix with perovskite crystals and scintillator particles. The perovskite crystals provide high conductivity and charge carrier mobility to overcome the conductivity limitations of pure organic semiconductors in thick layers, while the scintillator particles enhance X-ray absorption. This composite approach allows thick layers (≥10 μm) to maintain both sensitivity and conductivity.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent changes the physical and chemical parameters of the detection layer by incorporating perovskite crystals with specific properties (high mobility, appropriate bandgap) into the organic semiconductor matrix. This parameter change transforms the material properties to achieve both thick layer capability and maintained conductivity, resolving the contradiction between layer thickness and charge carrier extraction efficiency.

Inventive Principle:
Principle #35Parameter changes

2Quantity of substance

If organic semiconductors are used in thick layers for X-ray detection, then the radiation absorption is improved, but the detection speed is deteriorated

Engineering Contradiction:
Improvelayer thicknessVSAvoiddetection speed
Core Design Contradiction:
Quantity of substanceVSSpeed

Solution Approach 1:

The composite material system incorporates perovskite crystals known for their high charge carrier mobility into the organic semiconductor matrix. This enables thick detection layers to maintain fast charge carrier transport, preserving detection speed while achieving the necessary radiation absorption through increased layer thickness.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

By changing the material composition to include perovskite crystals with high mobility parameters, the patent achieves a detection layer that maintains fast response times even at thicknesses of ≥10 μm, thus resolving the contradiction between layer thickness and detection speed.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If inorganic scintillator materials are mixed into organic semiconductor matrix, then the optical cross-talk is minimized, but the manufacturing complexity increases

Engineering Contradiction:
Improveoptical cross-talk minimizationVSAvoidmanufacturing complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the detection layer into distinct functional components: organic semiconductor matrix, perovskite crystals, and scintillator particles. This segmentation allows each component to perform its specific function optimally while maintaining manufacturability through established techniques like screen printing and sintering.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the processing parameters and methods to accommodate the composite structure, using sintering processes and screen printing techniques that are compatible with both organic and inorganic materials. This approach manages the manufacturing complexity while achieving the desired optical cross-talk minimization.

Inventive Principle:
Principle #35Parameter changes

4Reliability

If perovskite crystals with thickness of at least 10 μm are used, then the conductivity and mobility are improved, but the manufacturing precision requirements increase

Engineering Contradiction:
ImproveconductivityVSAvoidlayer thickness control
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent specifies a minimum thickness parameter (≥10 μm) for the perovskite crystal layer to ensure adequate conductivity and charge carrier mobility. This parameter specification guides the manufacturing process to achieve the required electrical properties while managing the precision requirements through controlled deposition and sintering processes.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution improves the efficiency and conductivity of X-ray detection layers, enabling better image quality with reduced irradiation and broader radiation absorption, thus enhancing medical imaging capabilities.

Implementation Method 1

In direct conversion I, an X-ray quantum 1 excites a particle 2 and electron/hole pairs 2a, 2b are formed which then migrate to the electrodes 4 (anode and cathode, for example, pixel electrodes) and are detected there.

Methodology Applied
Scientific EffectDirect X-ray conversion: Photoelectric Effect

Implementation Method 2

In indirect conversion II, the X-ray quantum 1 excites the particle 2 which, in turn, emits radiation 2′ with a lower energy (e.g. visible light, UV, or IR radiation) which is then detected by means of a photodetector 3 (e.g. photodiode).

Methodology Applied
Scientific EffectScintillation: Scintillation

Implementation Method 3

The production of the detection layer comprises a sintering process, comprising: a) provision of a powder comprising perovskite crystals; b) application of the powder onto the substrate; c) application of pressure and optionally temperature for compaction of the powder.

Methodology Applied
Scientific EffectSintering: Sintering

Data Source

PatentUS9983319B2Detection layer comprising perovskite crystals
Publication Date: 2018.05.29 SIEMENS HEALTHINEERS AG
  • US9983319B2 patent drawing
  • US9983319B2 patent drawing
  • US9983319B2 patent drawing

AI summary

The present disclosure relates to a detection layer on a substrate. For example, a detection layer may include perovskite crystals of the type ABX3 and/or AB2X4. A may include at least one monovalent, divalent or trivalent element from the fourth or a higher period in the periodic table and/or mixtures thereof. B may include a monovalent cation, the volumetric parameter of which is sufficient, with the respective element A, for perovskite lattice formation. X may be selected from the group consisting of anions of halides and pseudohalides. The layer may have a thickness of at least 10 μm.