Phase Contrast Imaging Using Pencil Radiation Beams

The patent divides the scanning process into multiple discrete pencil radiation beams that are sequentially directed at different target regions. Each pencil beam maintains high spatial resolution by being narrowly focused, while the overall scanning coverage is expanded by systematically moving between multiple discrete beam positions. This segmentation allows the system to achieve both fine resolution at each measurement point and broad coverage across the entire object.

The patent employs periodic action by sequentially sending multiple pencil radiation beams in a systematic sequence rather than simultaneously. Each beam is directed at a specific target region in turn, allowing the detector to clearly distinguish incident regions without confusion from overlapping beams. This sequential periodic approach maintains measurement precision while achieving improved productivity through rapid cycling through multiple beam positions.

The patent addresses the limitation of small active areas in high-resolution sensors by introducing temporal dimension through sequential beam scanning. Instead of requiring all target regions to be simultaneously visible on a single sensor plane, the system scans through different spatial positions over time. This allows a smaller high-resolution sensor to effectively cover a larger area by accumulating measurements from multiple sequential positions, thereby maintaining measurement precision without requiring an excessively large or complex sensor array.