3D Shape Measurement Using Phase and Defocus Data

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Solution Overview

Problem

Current 3D shape measurement technologies face challenges in accurately measuring objects with abrupt shape changes and discontinuities using a small number of projected patterns, as existing methods struggle with phase unwrapping and real-time measurement capabilities.

Innovation Solution

A three-dimensional shape measurement apparatus that projects a periodic pattern onto a measurement area, captures images, and calculates phase information and defocus amounts to determine the object's shape, using a combination of phase information calculation and defocus amount calculation units to handle abrupt shape changes and discontinuities.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a Fourier transformation method is used for phase measurement, then measurement precision is improved, but phase unwrapping becomes difficult for objects with abrupt shape changes

Engineering Contradiction:
Improvephase measurement precisionVSAvoidphase unwrapping difficulty
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent divides the measurement area into multiple local regions and performs phase unwrapping independently in each region. By segmenting the global phase unwrapping problem into smaller local problems, the method can handle abrupt shape changes and discontinuities more effectively, as each local region can be processed with continuity assumptions that are more likely to hold locally.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces defocus amount as an additional measurement dimension alongside phase information. By combining phase data with defocus amount data, the system gains an extra degree of freedom for resolving phase ambiguities, enabling accurate measurement of objects with abrupt shape changes without relying solely on phase continuity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If many patterns are projected to calculate defocus amounts, then measurement precision is improved, but measurement time increases making real-time measurement difficult

Engineering Contradiction:
Improvedepth measurement precisionVSAvoidmeasurement speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent calculates defocus amounts selectively at specific sampling points rather than for all pixels or regions. By performing defocus calculation only where necessary (partial action), the system achieves sufficient measurement precision while significantly reducing the computational burden and number of required patterns, enabling real-time measurement capability.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The patent performs phase measurement first to obtain initial phase information, then uses this phase data to guide subsequent defocus amount calculations. By preparing phase information in advance, the system can focus defocus calculations only in regions where they are most needed, reducing overall measurement time while maintaining precision.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If phase unwrapping is performed using phase continuity for smooth objects, then measurement precision is improved, but the method fails for objects with discontinuous shapes

Engineering Contradiction:
Improveshape measurement precisionVSAvoidapplicability to discontinuous objects
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent segments the measurement area into multiple local regions and performs phase unwrapping independently in each region. This segmentation allows the method to handle discontinuous objects by treating each continuous local region separately, avoiding the phase continuity assumption failure that occurs in global unwrapping for discontinuous shapes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent combines phase information with defocus amount information to create a multi-dimensional measurement approach. This additional dimension provides alternative pathways for phase unwrapping that do not rely solely on phase continuity, enabling successful measurement of discontinuous objects where traditional single-dimensional phase unwrapping fails.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables high-precision shape measurement of objects with abrupt shape changes and discontinuities using a small number of projected patterns, improving measurement accuracy and efficiency.

Implementation Method 1

a pattern projection unit configured to project a pattern having a periodicity onto a measurement area

Methodology Applied
Scientific EffectOptical projection: Light

Implementation Method 2

a capturing unit configured to capture an image of an area onto which the pattern is projected

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 3

a phase information calculation unit configured to calculate phase information of a pattern of an image captured by the capturing unit

Methodology Applied
Scientific EffectPhase information: Phase Modulation

Implementation Method 4

a defocus amount calculation unit configured to calculate defocus amounts of the pattern in the captured image

Methodology Applied
Scientific EffectDefocus blur: Depth of Field

Data Source

PatentUS8538726B2Three dimensional shape measurement apparatus, three dimensional shape measurement method, and computer program
Publication Date: 2013.09.17 CANON KK
  • US8538726B2 patent drawing
  • US8538726B2 patent drawing
  • US8538726B2 patent drawing

AI summary

A 3D shape measurement apparatus for measuring a 3D shape of an object existing on a measurement area, comprising, a pattern projection unit for projecting a pattern having a periodicity onto the measurement area, and a capturing unit for capturing an image of the area where the pattern is projected, wherein the measurement area is specified by a reference plane, a projection area of the pattern projection unit, and a capturing area of the capturing unit, and the pattern projection unit projects the pattern to be focused on the reference plane. The apparatus further comprises a first calculation unit for calculating phase information of a pattern of the captured image, a second calculation unit for calculating defocus amounts of the pattern in the captured image, and a third calculation unit for calculating a 3D shape of the object based on the phase information and the defocus amounts.