Phase Diversity Inspection Imaging for In-Field Focus Correction

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Solution Overview

Problem

Existing inspection systems face challenges in achieving high-resolution imaging of sub-100 nanometer IC components due to limitations in focus measurement and aberrations, leading to low throughput, inaccurate focus adjustments, and reduced image quality.

Innovation Solution

Implementing a phase diversity analysis to determine focus-related values and maximum likelihood estimates for images within the field of view, allowing for the generation of focus-adjusted images without the need for external focus measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If external focus measurements are performed outside the field of view to adjust focus, then focus adjustment can be made, but the measurements do not accurately represent the actual focus conditions within the inspection area, leading to inaccurate focus correction

Engineering Contradiction:
Improvefocus measurement accuracyVSAvoidfocus measurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system uses the inspection images themselves to determine focus quality metrics, rather than requiring separate external focus measurements. The focus quality metric is calculated directly from the inspection images by analyzing edge sharpness and contrast, allowing the system to self-evaluate and self-correct focus conditions without external intervention

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The focus measurement function is extracted from the traditional external focus measurement system and integrated directly into the inspection image processing pipeline. By calculating focus quality metrics from the inspection images themselves, the system eliminates the need for separate focus measurement apparatus and procedures

Inventive Principle:
Principle #2Taking out (Extraction)

2Manufacturing precision

If multiple images are captured and processed through phase diversity analysis to correct focus deviations, then image quality and sharpness are improved, but computational load and processing time increase

Engineering Contradiction:
Improveimage qualityVSAvoidprocessing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The system applies phase diversity analysis selectively based on the calculated focus quality metric. When the metric indicates acceptable focus, full phase diversity processing is skipped. Processing is applied only when and where focus deviations are detected, reducing overall computational load while maintaining image quality where needed

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The field of view is divided into multiple regions, and phase diversity analysis is applied independently to each region based on its specific focus quality. This allows parallel processing of different regions and enables the system to focus computational resources only on areas with focus problems rather than processing the entire field uniformly

Inventive Principle:
Principle #1Segmentation

3Productivity

If focus adjustments are made based on measurements taken outside the field of view, then focus can be adjusted, but throughput is reduced due to inaccurate adjustments requiring re-inspection

Engineering Contradiction:
Improveinspection throughputVSAvoidfocus adjustment accuracy
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system calculates a focus quality metric from inspection images and uses this metric as feedback to automatically adjust focus settings. This closed-loop feedback ensures that focus adjustments are based on actual focus conditions within the inspection area, improving both accuracy and throughput by eliminating the need for re-inspection due to incorrect focus adjustments

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The inspection system performs its own focus evaluation and adjustment using the inspection images, eliminating the need for separate external focus measurement steps that reduce throughput. The system self-corrects focus deviations directly from the inspection data, maintaining productivity while improving reliability

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS20250285227A1System and method for improving image quality during inspection
Publication Date: 2025.09.11 ASML NETHERLANDS BV
  • US20250285227A1 patent drawing
  • US20250285227A1 patent drawing
  • US20250285227A1 patent drawing

AI summary

Systems, apparatuses, and methods for improving image quality. In some embodiments, a method may include obtaining a plurality of images of an area of a sample; determining via a phase diversity analysis: ma plurality of focus-related values, wherein each focus-related value of the plurality of focus-related values is associated with each image of the plurality of images; a maximum likelihood estimate of the plurality of images; and generating a focus-corrected image of the area based on the determined plurality of focus-related values and the determined maximum likelihood estimate.