Phase Grating Wave Surface Analysis Device
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Solution Overview
Problem
Existing methods for analyzing wave surfaces using two-dimensional diffraction gratings are complex and limited in measuring severely disturbed light beams or fragmented wave surfaces, particularly due to the need for spatial filtering systems and precise alignment of intensity and phase gratings.
Innovation Solution
A method and device utilizing a phase function that combines an exclusion zone and a fundamental phase function to diffract light beams into rectangular or hexagonal meshings, allowing for the measurement of wave surface gradients without the need for spatial filtering and enabling flexible adjustment of sensitivity and dynamics, while eliminating the requirement for precise alignment of intensity and phase gratings.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a two-dimensional diffraction grating with intensity and phase functions is used for wave surface analysis, then the measurement precision of wave surface gradients is improved, but the device complexity increases due to the need for spatial filtering systems and precise alignment of intensity and phase gratings
Solution Approach 1:
The patent extracts and eliminates the spatial filtering system from the interferometer configuration. By using a phase grating without intensity modulation, the harmful spatial filtering component is removed, simplifying the device while maintaining measurement precision through pure phase diffraction mechanisms
Solution Approach 2:
The patent merges the intensity and phase grating functions into a single phase grating structure. This consolidation eliminates the need for separate intensity and phase grating alignment, reducing device complexity while preserving the ability to measure wave surface gradients through the combined diffraction pattern
2Adaptability or versatility
If intensity and phase gratings are used together in a two-dimensional grating system, then the versatility of wave surface analysis is improved, but the ease of operation deteriorates due to the requirement for precise alignment of multiple grating components
Solution Approach 1:
The patent combines the functionality of separate intensity and phase gratings into a single phase grating component. This merger maintains the versatility of analyzing different wave surface characteristics while eliminating the operational complexity of aligning multiple grating components, as only one grating needs to be positioned and oriented
3Productivity
If a phase grating with exclusion zone and fundamental phase function is used, then the productivity of wave surface analysis is improved through continuous dynamic adjustment, but the manufacturing precision requirement increases for creating the complex phase pattern
Solution Approach 1:
The patent segments the phase grating function into two distinct components: an exclusion zone function that defines the active measurement regions and a fundamental phase function that provides the diffraction mechanism. This segmentation allows each component to be optimized independently, with the exclusion zone controlling measurement dynamics and the phase function ensuring manufacturing feasibility through well-established phase grating fabrication techniques
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient analysis of wave surfaces with continuous dynamic adjustment, capable of measuring severely disturbed light beams and fragmented wave surfaces without limitations on amplitude differences, and allows for bidirectional gratings to be manufactured in a single step, improving compactness and ease of implementation.
Implementation Method 1
a phase function introduced by a two-dimensional grating placed substantially in a plane perpendicular to the light beam to be analyzed, optically conjugated of the plane of analysis of the wave surface and causing a diffraction of the beam into different emerging beams
Implementation Method 2
an image formed by the interference of emerging beams being created and viewed in a plane (PS) located at a selected distance from the plane of the grating (PC)
Data Source
AI summary
The application relates to a method for analyzing the wave surface of a light beam from a source to the focus of a lens. The beam illuminates a sample on the analysis plane and having a defect. A diffraction grating of the plane is a conjugate of an analysis plane through a focal system. An image is formed in a plane at a distance from the grating plane and analyzed by processing means. The invention encodes this grating by a phase function resulting from the multiplication of two phase functions, a first exclusion function defining a meshing of useful zones transmitting the beam to be analyzed in the form of light pencil beams, and a second phase fundamental function which creates a phase opposition between two light pencil beams coming out of adjacent meshes of the exclusion grating.