3D Measurement Phase Matching Using Embedded Marker Lines
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Solution Overview
Problem
Existing three-dimensional measurement technologies using geometric constraint matching for phase matching suffer from low matching accuracy, leading to low three-dimensional reconstruction accuracy due to single feature information and unclear feature differences.
Innovation Solution
A method that embeds marker line information into sinusoidal stripe patterns, projects them onto an object, and uses combined phase shift and spatial phase unwrapping techniques to improve phase matching accuracy, involving left and right cameras for precise spatial phase matching and triangulation ranging for three-dimensional reconstruction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If geometric constraint matching method is used for phase matching, then solution speed is fast and no additional patterns are needed, but matching accuracy is low due to single feature information and unclear feature differences
Solution Approach 1:
The patent merges marker line information with sinusoidal stripe patterns to create composite projection patterns. This combines the advantages of marker lines (clear feature differentiation) with sinusoidal patterns (efficient phase encoding), resolving the contradiction between matching accuracy and measurement efficiency
Solution Approach 2:
The patent uses composite projection patterns that integrate marker line features with sinusoidal intensity modulation. This composite approach combines the structural clarity of marker lines with the phase-encoding capability of sinusoidal waves, achieving both high matching accuracy and fast solution speed
2Measurement precision
If geometric constraint matching method is used for phase matching, then no additional patterns need to be projected, but three-dimensional reconstruction accuracy is low due to low matching accuracy
Solution Approach 1:
The patent performs preliminary phase unwrapping based on marker line spatial relationships before final phase matching. This preliminary action establishes accurate phase references that guide subsequent matching operations, ensuring high reconstruction accuracy without requiring multiple additional pattern projections
Solution Approach 2:
The patent introduces marker line-based spatial phase relationships as an intermediary to facilitate accurate phase matching. These intermediary phase references bridge the gap between projected patterns and object surface geometry, enabling high-precision reconstruction while maintaining measurement efficiency
Data Source
AI summary
A three-dimensional measurement method combines the three-step phase shift method to embed the marker line information into the sinusoidal stripe pattern to obtain the target stripe pattern. The target stripe pattern is projected onto the surface of the object to be measured, and the wrapped phase image, mean intensity image and modulated intensity image of the stripe pattern collected by the left and right cameras are solved. The mask image according to the mean intensity image and modulation intensity image is solved to extract the marker line. The spatial phase unwrapping starting from the marker line in the wrapped phase image is performed to obtain the spatial phase. The spatial phase matching based on the unique correspondence between the left and right cameras based on the spatial phase of the marker line is performed, the best matching point of the right camera is obtained.