Phase Shift Measurement Pattern for Topographic Profilometry

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Solution Overview

Problem

Conventional topographical measurement methods require multiple image recordings to achieve unambiguity in phase images, leading to increased measurement time and complexity, especially in time-critical applications like mobile profilometry.

Innovation Solution

A method and device that project a sequence of measurement patterns with periodically modulated phase shift patterns and stationary value sequences, allowing independent evaluation of phase shift and modulation, reducing the number of necessary image recordings by using a redundant value sequence that can be decoded separately from the phase image.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple measurement patterns with phase shift patterns are projected onto the object, then measurement precision is improved, but measurement time increases

Engineering Contradiction:
Improvetopographical measurement precisionVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent combines phase shift patterns with value sequence patterns into a single measurement pattern that can be evaluated independently. This merging allows extraction of both phase information and uniqueness information from one pattern, reducing the total number of patterns needed while maintaining measurement precision

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The measurement pattern serves multiple functions simultaneously: it provides phase information for topographical measurement and contains value sequences for unambiguous identification. This multi-functionality eliminates the need for separate patterns for each purpose, reducing measurement time

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If multiple measurement patterns are projected to achieve unambiguity, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveunambiguous topographical measurementVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges phase encoding and value sequence encoding into a single measurement pattern structure. This combination allows the system to achieve unambiguous measurements without requiring multiple separate pattern projection systems, thereby reducing device complexity

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The measurement pattern is segmented into independently evaluable portions: phase shift pattern components and value sequence components. This segmentation allows independent evaluation of each component, simplifying the overall measurement system while maintaining unambiguous measurement capability

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly reduces measurement time by at least a third, making it more efficient and suitable for time-critical applications, while maintaining the integrity of phase images and providing fault tolerance through error correction.

Implementation Method 1

two-dimensional recording of the light reflected from the front of the wheel from a direction other than the direction of light projection by an image converter

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentEP2259013B1Topographical measurement of an object
Publication Date: 2013.11.20 SIEMENS AG
  • EP2259013B1 patent drawingFigure 1
  • EP2259013B1 patent drawingFigure 2
  • EP2259013B1 patent drawingFigure 3

AI summary

The method involves projecting a sequence of multiple measurement patterns (3) onto an object (1) by a projection unit (2), where each measurement pattern contains a periodically modulated phase shifting pattern modulated with a value sequence. The phase shifting patterns have a phase shift relative to one another, where the value sequences are stationarily fixed relative to one another. An independent claim is also included for an apparatus for topographic measurement of an object.