3D Measurement System Using Phase-Shifted Pattern Projection

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Solution Overview

Problem

Conventional 3D shape measurement systems struggle with high-speed tracking of moving objects due to limited time resolution, as they require multiple frames to update three-dimensional measurement results, restricting the measurement of fast-moving subjects.

Innovation Solution

A measurement system that projects and images first and second pattern images with different phases, allowing for higher time resolution by measuring absolute and relative distance changes, and dynamically adjusting projection sequences to track object movement and acceleration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional 3D shape measurement systems use multiple frames to update measurement results, then measurement precision is improved, but time resolution deteriorates

Engineering Contradiction:
Improve3D measurement precisionVSAvoidtime resolution
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system uses periodic projection of binary pattern images with different phases (0 phase and 90 degree phase) to enable time-resolved 3D measurement. By projecting patterns in alternating frames with different phases, the system can update measurement results more frequently while maintaining precision, achieving high-speed tracking of moving objects.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The measurement process is segmented into multiple binary patterns (first through fourth binary patterns) that are projected in sequence. Each pattern provides partial measurement data, and by combining results from multiple segmented patterns, the system achieves accurate 3D measurement with improved time resolution compared to conventional single-frame methods.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If the system projects multiple binary patterns sequentially, then measurement precision is improved, but tracking capability of moving objects deteriorates

Engineering Contradiction:
Improve3D shape measurement precisionVSAvoidtracking speed
Core Design Contradiction:
Measurement precisionVSSpeed

Solution Approach 1:

The system employs periodic projection of binary patterns with alternating phases (0 and 90 degrees) across consecutive frames. This periodic structure allows the system to maintain measurement precision while adapting to moving objects, as the phase alternation provides reference information for tracking motion between frames.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The projection sequence is dynamically adjusted based on object movement. The system uses the phase information from alternating binary patterns to track and compensate for object motion, enabling high-speed tracking capability while maintaining accurate 3D measurement of moving subjects.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system achieves higher time resolution in tracking moving objects, enabling accurate measurement of subjects moving at speeds up to 30 meters per second, with improved robustness and applicability to various fields such as sports and medical imaging.

Implementation Method 1

a projection apparatus that projects, onto a subject, first pattern light indicating a first pattern projection image

Methodology Applied
Scientific EffectLight: Light

Implementation Method 2

at least one imaging apparatus that images the first pattern light and generates an imaged image

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS10240915B2Measurement system, measurement method, and vision chip
Publication Date: 2019.03.26 PANASONIC INTELLECTUAL PROPERTY CORP OF AMERICA
  • US10240915B2 patent drawing
  • US10240915B2 patent drawing
  • US10240915B2 patent drawing

AI summary

A measurement system includes: a projection apparatus that projects, onto a subject, first pattern light indicating a first pattern projection image including a first pattern image corresponding to a specific bit in gray code obtained by gray-coding projection coordinates stipulated by a projection coordinate system, and a second pattern image having the same cycle as the first pattern image, but having a different phase from the first pattern image, following a projection sequence where projections of the first and second pattern images coexist; and at least one imaging apparatus that images the first pattern light and generates an imaged image.