Phased-Array Calibration With Leakage Compensation

The patent segments the calibration process into two distinct phases: (1) a fast coarse calibration phase where all elements are calibrated simultaneously using total array measurements, and (2) a precise fine calibration phase where individual elements are calibrated using the previously developed leakage compensation techniques. This segmentation allows the system to benefit from both fast bulk measurement and accurate individual element measurement without the time penalty of fully sequential calibration.

The patent applies preliminary action by first performing a complete array calibration to establish baseline leakage characteristics before attempting individual element measurements. The system pre-characterizes the leakage patterns of all elements and uses this information to compensate for leakage during subsequent individual element calibrations, thereby enabling accurate measurements without excessive time requirements.

The patent converts the harmful leakage effect into a beneficial measurement resource. Instead of simply trying to suppress leakage through higher attenuation, the system actively measures the leakage signals from other elements and uses them to compensate for their interference. By characterizing the leakage patterns and incorporating them into the measurement model, the system turns the previously problematic leakage into useful information that enhances measurement accuracy.

The patent implements feedback by using the measured leakage characteristics from all antenna elements to continuously compensate for interference during individual element measurements. The system measures total array responses, extracts individual element contributions while accounting for leakage, and uses this feedback information to refine subsequent measurements, thereby maintaining high accuracy without requiring excessive attenuation.

The patent merges multiple measurement objectives into a unified calibration approach. Instead of treating each element calibration as a separate sequential task, the system combines all element calibrations into an integrated process that simultaneously extracts parameters for all elements by analyzing total array measurements. This merging approach reduces the overall calibration time while maintaining accuracy for large-scale arrays.

The patent uses copying by measuring the total array response multiple times under different excitation conditions and using these copies of the measurement data to mathematically extract individual element characteristics. Rather than physically isolating and measuring each element separately, the system creates virtual measurements through mathematical processing of total array responses, thereby scaling efficiently to large numbers of elements.