Read Margin Control Circuit Using Phased Delays for Sampling Alignment

The patent applies preliminary action by pre-establishing multiple fixed delay stages that create predetermined delay signals with different phases. These delay stages are configured in advance with specific delay amounts, allowing the memory controller to quickly select and apply the appropriate delay without performing iterative adjustments when operating conditions change. This pre-configured structure enables rapid adaptation to voltage and temperature variations.

The patent implements dynamics by making the delay amount adjustable through selection signals that can dynamically switch between multiple fixed delay stages. The memory controller can adaptively select different delay amounts based on operating conditions, allowing the system to dynamically adjust the sampling point position without requiring time-consuming iterative training procedures.

The patent applies preliminary action by pre-configuring multiple fixed delay stages with predetermined delay amounts before operation. This allows the memory controller to immediately select an appropriate delay setting without performing iterative read commands, thereby maintaining high memory access speed while still achieving sampling point optimization through the pre-established delay structure.

The patent applies segmentation by dividing the delay circuit into multiple fixed delay stages, each providing a specific delay amount. This segmented structure allows the memory controller to select individual stages or combinations thereof to achieve the optimal sampling point without requiring iterative adjustments, thus maintaining productivity while achieving precision.

The patent implements dynamics by enabling the memory controller to adaptively select different delay amounts from multiple fixed delay stages based on detected operating conditions such as voltage and temperature changes. This dynamic selection capability allows the system to maintain proper sampling point alignment despite signal shifts caused by environmental variations.

The patent applies parameter changes by varying the delay amount parameter through selection signals that switch between different fixed delay stages. When voltage or temperature changes cause signal shifts, the memory controller changes the delay parameter to compensate, thereby maintaining sampling point alignment with the center of the data valid window across different operating conditions.