Photoacid Generator Segmentation for Lithography Roughness

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Solution Overview

Problem

Current photoresist compositions for high-resolution lithography lack controlled solubility in both aqueous and non-aqueous solvents, leading to issues with line edge roughness, linewidth roughness, and pattern profile, while also requiring improved process control and diffusion properties.

Innovation Solution

A novel photoacid generator compound with a sulfonium cation and fluorinated groups, spatially segregated from aromatic rings through heteroatom-containing connecting groups, providing high solubility in both alkaline and organic solvents, enabling uniform distribution and improved resolution in photoresists.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional photoacid generators are used, then photoresist composition is simpler, but solubility control in both aqueous and non-aqueous solvents is insufficient leading to line edge roughness and linewidth roughness

Engineering Contradiction:
Improveline edge roughness and linewidth roughnessVSAvoidphotoacid generator molecular structure
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The photoacid generator molecule is segmented into distinct functional regions: a cationic portion containing fluorinated groups spatially segregated from aromatic rings through heteroatom-containing connecting groups, and an anionic portion. This segmentation enables independent optimization of solubility properties in both aqueous and organic solvents, resolving the roughness issue without requiring overly complex molecular structures.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the photoacid generator molecule are assigned specific local properties: the fluorinated cationic portion provides solubility in organic solvents and low absorbance, while the anionic portion ensures solubility in aqueous developers. This local quality differentiation allows the molecule to simultaneously achieve controlled solubility in both solvent types, eliminating line edge and linewidth roughness.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If photoacid generators with low absorbance are used, then resolution improves, but solubility characteristics in aqueous and non-aqueous solvents become difficult to control

Engineering Contradiction:
Improvephotoresist resolutionVSAvoidsolubility control in aqueous and non-aqueous solvents
Core Design Contradiction:
Manufacturing precisionVSAdaptability or versatility

Solution Approach 1:

The photoacid generator functions as a composite molecular structure combining fluorinated cationic groups with low absorbance properties and anionic groups with controlled solubility. This composite approach allows simultaneous achievement of high resolution (through low absorbance) and controlled solubility in both aqueous and non-aqueous solvents, resolving the adaptability issue.

Inventive Principle:
Principle #40Composite materials

3Manufacturing precision

If photoresist composition is optimized for high resolution, then smaller critical dimension is achieved, but process control tolerances such as exposure latitude and depth of focus are reduced

Engineering Contradiction:
Improvecritical dimensionVSAvoidexposure latitude and depth of focus
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The photoacid generator's solubility parameters are changed through strategic placement of fluorinated groups and heteroatom-containing connecting groups. This parameter optimization enables the photoresist to maintain high resolution (smaller critical dimension) while improving process control tolerances including exposure latitude and depth of focus, as the controlled solubility ensures uniform acid generation and development across varying process conditions.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The photoacid generator achieves enhanced photoresist resolution, reduced line edge and linewidth roughness, and improved pattern profiles by ensuring high solubility in various developers, thus addressing the limitations of existing PAGs in microlithography.

Implementation Method 1

patternwise exposing the photoresist composition layer to actinic radiation

Methodology Applied
Scientific EffectPhotoacid generation: Photopolymerisation

Implementation Method 2

high solubility in both alkaline and organic solvents, enabling uniform distribution

Methodology Applied
Scientific EffectSolubility: Solvation

Implementation Method 3

developing the pattern by treatment with an aqueous alkaline developer to form a positive tone relief image

Methodology Applied
Scientific EffectChemical etching: Chemical Bonding

Data Source

PatentUS9029065B2Photoacid generating compound and photoresist composition comprising same, coated article comprising the photoresist and method of making an article
Publication Date: 2015.05.12 DUPONT ELECTRONIC MATERIALS INT LLC
  • US9029065B2 patent drawing
  • US9029065B2 patent drawing
  • US9029065B2 patent drawing

AI summary

A compound having the formula (I):wherein a is an integer of from 1 to 10, and x is an integer of from 1 to 3, X1 comprises a fluoroalcohol, fluorinated ester, or fluorinated anhydride, Y is a single bond, C1-20 alkylene group, O, S, NR, ester, carbonate, sulfonate, sulfone, or sulfonamide, wherein R is H or C1-20 alkyl, and wherein the C1-20 alkylene group is structurally only carbon, or one or more structural carbon atoms in the C1-20 alkylene group is replaced by oxygen, carbonyl, ester, or a combination comprising at least one of the foregoing, Ar is a substituted or unsubstituted, C5 or greater monocyclic, polycyclic, or fused polycyclic cycloalkyl; or a substituted or unsubstituted, C5 or greater monocyclic, polycyclic, or fused polycyclic aryl group, wherein the cycloalkyl or aryl is a carbocycle or comprises a heteroatom comprising O, S, N, F, or a combination comprising at least one of the foregoing, each R1 is independently a substituted C5-40 aryl, substituted C5-40 heteroaryl, C1-40 alkyl, a C3-40 cycloalkyl, wherein when x is 1, the two groups R1 are separate or bonded to each other to form a C4-40 ring structure, and Z− is a carboxylate, sulfate, sulfonate, sulfamate, or the anion of a sulfonimide, wherein when Y is a single bond, Z− is not sulfonate.