Photoelectric Conversion Element Transistor Channel Width Optimization

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Solution Overview

Problem

Conventional techniques fail to effectively reduce Random Telegraph Noise (RTN) in CMOS linear image sensors, leading to image quality degradation due to vertical streaks caused by crystal defects in transistors, particularly in source follower transistors.

Innovation Solution

The effective channel width of transistors, especially source follower transistors, is increased relative to other transistors to minimize the impact of RTN by avoiding crystal defects, thereby reducing noise and improving image quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If the size of the amplification transistor is reduced to prevent capacitance hanging in FD area, then charge voltage conversion gain is improved, but RTN impact increases due to smaller channel area

Engineering Contradiction:
Improvecharge voltage conversion gainVSAvoidRTN impact
Core Design Contradiction:
PowerVSObject-affected harmful factors

Solution Approach 1:

The patent applies local quality by making the effective channel width of specific transistors (source follower transistors and amplification transistors) larger than other transistors in the pixel circuit. This localized enlargement of channel width in critical positions reduces RTN impact where it most affects image quality, while keeping other transistor sizes optimized for overall circuit performance and miniaturization.

Inventive Principle:
Principle #3Local quality

2Object-affected harmful factors

If detailed setting of transistors is implemented to reduce RTN, then RTN impact on image is reduced, but device complexity increases

Engineering Contradiction:
ImproveRTN impact on imageVSAvoidtransistor configuration complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by specifically adjusting the effective channel width parameter of certain transistors to be larger than others. This single parameter modification (effective channel width) provides a straightforward method to reduce RTN impact without requiring complex circuit architectures or multiple additional components, thus minimizing the increase in device complexity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively reduces RTN impact, resulting in improved image quality by increasing the probability of current flow through defect-free areas, making vertical streaks less noticeable and enhancing overall image clarity.

Implementation Method 1

a photoelectric conversion unit (PD)

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Data Source

PatentEP3531693B1Photoelectric conversion element and image processing apparatus
Publication Date: 2021.03.03 RICOH CO LTD
  • EP3531693B1 patent drawingFigure 1
  • EP3531693B1 patent drawingFigure 2
  • EP3531693B1 patent drawingFigure 3

AI summary

A photoelectric conversion element (1) includes a plurality of pixels (10) to receive light; and a signal processor (11) to process a signal of the pixels. The signal processor (11) includes: a first element (SF1; SF2), being a transistor, having a first effective channel width (We1) through which a current can effectively pass through in the first element; and a second element (RS, T, SL, SW; Is2; SF1), being a transistor, having a second effective channel width through which a current can effectively pass through in the second element (We2). The first effective channel width of the first element (We1) is larger than the second effective channel width (We2) of the second element.