Photomask ESD Line with Comb-Shaped Edge Structure

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Solution Overview

Problem

Existing photomasks suffer from electrostatic discharge (ESD) damage during the photolithography process, particularly at the edges and corners of the circuit pattern, due to accumulated electric charges from frequent contact with mask holders, leading to pattern distortion and damage.

Innovation Solution

A photomask design featuring an electrostatic discharge (ESD) structure with a comb-shaped ESD line extending beyond the edge of the ESD structure, including segments and pins that protrude towards the substrate edge, effectively discharging electric charges away from the circuit pattern, thereby reducing ESD damage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a simple ESD ring structure is used, then the device complexity is reduced, but the ESD protection effectiveness deteriorates

Engineering Contradiction:
ImproveESD structure complexityVSAvoidESD protection effectiveness
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The ESD line is segmented into multiple comb-shaped structures with pins and segments arranged in series, creating multiple discharge points along the ESD line to enhance protection effectiveness

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The ESD line extends beyond the edge of the substrate in addition to surrounding the circuit pattern, adding a dimensional element that provides additional discharge paths for edge-generated static electricity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If the ESD line extends beyond the substrate edge, then the ESD protection coverage is improved, but the manufacturing precision requirement increases

Engineering Contradiction:
ImproveESD protection coverageVSAvoidESD line positioning accuracy
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The ESD line is designed to extend beyond the substrate edge in advance, creating a buffer zone that allows static electricity to be discharged before reaching the circuit pattern, providing a safety margin for manufacturing variations

Inventive Principle:
Principle #10Preliminary action

3Reliability

If comb-shaped structures with pins are added to the ESD line, then the charge discharge efficiency is improved, but the device complexity increases

Engineering Contradiction:
ImproveCharge discharge efficiencyVSAvoidESD line structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Comb-shaped structures with pins are added at specific locations along the ESD line, particularly at the edge portion, to create localized high-efficiency discharge zones without making the entire structure complex

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The comb-shaped ESD line design efficiently discharges electric charges before they reach the circuit pattern, maintaining pattern accuracy and preventing damage from ESD effects, ensuring reliable semiconductor manufacturing.

Implementation Method 1

the ESD line includes an edge portion extending beyond an end of an edge of the ESD structure, and the edge portion of the ESD line includes at least one comb-shaped structure... efficiently discharges electric charges before they reach the circuit pattern

Methodology Applied
Scientific EffectElectrostatic discharge: Electrostatic Discharge

Data Source

PatentEP3850431B1Photomask with electrostatic discharge protection
Publication Date: 2023.06.14 YANGTZE MEMORY TECH CO LTD
  • EP3850431B1 patent drawingFigure 1
  • EP3850431B1 patent drawingFigure 2
  • EP3850431B1 patent drawingFigure 3

AI summary

A photomask is provided, the photomask includes a substrate (102), a circuit pattern (104) on the substrate (102), an electrostatic discharge (ESD) structure (106) on the substrate (102) and an ESD line (108a) on the substrate (102). The ESD structure (106) surrounds the circuit pattern (104). The ESD line (108a) extends between an edge of the substrate (102) and the ESD structure (106), in which the ESD line (108a) includes an edge portion (EP1a) extending beyond an end of an edge of the ESD structure (106), and the edge portion (EP1a) of the ESD line (108a) includes at least one comb-shaped structure (114).