Photomask Layout Decomposition for Optical Proximity Correction

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Solution Overview

Problem

The existing optical proximity correction (OPC) techniques for photomask design in semiconductor manufacturing often result in domain mismatches (DMMs) when neighboring chip domains converge to different solutions at their boundaries, leading to manufacturable issues and significant delays in the full-chip output.

Innovation Solution

The approach involves partitioning photomask design layouts into computational domains using a pathfinding algorithm with buffer regions and preferred boundary locations, avoiding features and regions on boundary edges, and employing a weighted graph for input into the A* algorithm to optimize domain boundaries and reduce DMMs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If photomask design layouts are partitioned into spatial sections for parallel processing, then computational efficiency is improved, but domain mismatches occur at boundaries when neighboring domains converge to different solutions

Engineering Contradiction:
Improvecomputational efficiencyVSAvoiddomain consistency
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The photomask design layout is divided into multiple spatial sections or domains that can be processed independently in parallel. Each domain is assigned to a separate computing resource, enabling simultaneous OPC processing while maintaining the ability to handle complex full-chip designs through distributed computation

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Buffer regions are introduced as intermediary zones between adjacent computational domains. These buffer regions contain features and data that are shared between neighboring domains, ensuring that when domains are processed independently and then reassembled, the boundary regions maintain consistency and avoid domain mismatches

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If buffer regions are added to prevent domain mismatches, then manufacturing precision is improved, but device complexity increases

Engineering Contradiction:
Improvedomain consistencyVSAvoidlayout complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The buffer regions are systematically divided and assigned to adjacent domains in a structured manner. Each domain receives its designated buffer region as part of its computational boundary, allowing the complexity to be managed through organized segmentation rather than unstructured additions

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Buffer regions are shared between adjacent domains, meaning the same physical region serves multiple purposes for neighboring computational units. This merging approach reduces overall complexity compared to creating separate buffer zones for each domain, as the buffer data is reused across domain boundaries

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20250005250A1Layout decomposition for optical proximity correction in photolithography masks
Publication Date: 2025.01.02 INTEL CORP
  • US20250005250A1 patent drawing
  • US20250005250A1 patent drawing
  • US20250005250A1 patent drawing

AI summary

Methods for layout decomposition of photolithographic masks are provided. The decomposition creates domains that can be sent to independent computing resources for optimization. A first partition is created for the photolithographic mask design. Buffer regions are created around photolithographic features and a search distance is selected. The buffer regions and search distance are used in a pathfinding algorithm to determine new boundaries for new domains. The methods can be stored, for example, on at least one machine-readable storage medium as non-transitory instructions.