Photonic Quasi-Monolithic Die Stacking for Sub-10 Micron Interconnects

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Solution Overview

Problem

Current packaging technologies for photonic integrated circuits (PICs) face challenges in achieving high-density interconnects for electrical and optical communication, leading to increased manufacturing complexity and cost, particularly in integrating optical signals with electronic circuits.

Innovation Solution

A photonic quasi-monolithic die architecture is introduced, comprising multiple IC dies with high-density interconnects, including a bridge die surrounded by dielectric material, a processor IC, a photonic IC, and a fiber connector, all connected with interconnects having pitches of less than 10 microns, enabling efficient electrical and optical coupling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If traditional IC packaging is used, then manufacturing process is simple, but interconnect density is low and bandwidth is limited

Engineering Contradiction:
Improveinterconnect densityVSAvoidpackaging complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The system is divided into multiple IC dies (processor die, memory die, photonic die) that are separately fabricated and then assembled together. Each die can be optimized for its specific function while the overall system achieves high interconnect density through the modular assembly structure with precise alignment features

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from planar, two-dimensional interconnect architecture to three-dimensional stacked architecture with vertical interconnects through the substrate. This adds a vertical dimension to the interconnect density, enabling high-bandwidth communication between layers while maintaining compact footprint

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Adaptability or versatility

If fiber coupling is implemented for optical access, then optical communication capability is achieved, but manufacturing complexity and cost increase

Engineering Contradiction:
Improveoptical communication capabilityVSAvoidfiber coupling complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The photonic die is merged with the electronic IC dies in a unified package structure, integrating optical and electronic functions. The fiber array is directly coupled to the photonic die surfaces, combining optical communication and electronic processing in a single integrated system rather than separate modules

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The substrate serves as an intermediary platform that provides both mechanical support and electrical interconnection between the photonic die and electronic dies. It mediates between the optical and electronic domains, enabling simultaneous electrical and optical access without requiring separate coupling mechanisms

Inventive Principle:
Principle #24Intermediary (Mediator)

3Quantity of substance

If high-density interconnects with pitch less than 10 microns are used, then interconnect density and bandwidth are improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improveinterconnect densityVSAvoidalignment precision
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

Precise alignment features and positioning structures are pre-formed on each die and the substrate during fabrication. These preliminary precision features ensure that when the dies are assembled, the high-density interconnects automatically align correctly without requiring post-assembly adjustment, thereby achieving sub-10 micron pitch with controlled manufacturing precision

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12631837B2Photonic quasi-monolithic die architectures
Publication Date: 2026.05.19 INTEL CORP
  • US12631837B2 patent drawing
  • US12631837B2 patent drawing
  • US12631837B2 patent drawing

AI summary

Microelectronic assemblies, related devices and methods, are disclosed herein. In some embodiments, a microelectronic assembly may include an interconnect die in a first layer surrounded by a dielectric material; a processor integrated circuit (processor IC) and an integrated circuit (IC) in a second layer, the second layer on the first layer, wherein the interconnect die is electrically coupled to the processor IC and the IC by first interconnects having a pitch of less than 10 microns between adjacent first interconnects; a photonic integrated circuit (PIC) and a substrate in a third layer, the third layer on the second layer, wherein the PIC has an active surface, and wherein the active surface of the PIC is coupled to the IC by second interconnects having a pitch of less than 10 microns between adjacent second interconnects; and a fiber connector optically coupled to the active surface of the PIC.