Photosensitive Device Degradation Testing With Adaptive Light Feedback

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Solution Overview

Problem

Conventional methods for testing photosensitive device degradation are costly, time-consuming, and often destructive, failing to accurately determine the performance and degradation rates of photosensitive devices, which can lead to unexpected failures and increased expenses.

Innovation Solution

A system and method for accelerated degradation testing that initializes degradation parameters, sets light intensity, and performs pixel performance measurements, comparing them to thresholds to determine failure, with the option to alter light intensity and environmental conditions, and store performance data for analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional degradation testing methods are used, then photosensitive device degradation can be tested, but the testing process is time-consuming and costly

Engineering Contradiction:
Improvedegradation rate determination accuracyVSAvoidtesting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies parameter changes by exposing photosensitive devices to accelerated degradation conditions with elevated light intensity (exceeding 1000 W/m²) and controlled environmental parameters (temperature, humidity) to compress the degradation timeline while maintaining measurement accuracy through systematic parameter variation

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If conventional degradation testing methods are used, then photosensitive device degradation can be tested, but the testing cost is high

Engineering Contradiction:
Improvedegradation rate determination accuracyVSAvoidtesting cost
Core Design Contradiction:
Measurement precisionVSLoss of energy

Solution Approach 1:

The patent reduces testing costs by implementing accelerated degradation protocols that achieve reliable degradation rate determination in compressed timeframes through controlled parameter escalation, thereby reducing operational expenses and resource consumption

Inventive Principle:
Principle #35Parameter changes

3Reliability

If conventional degradation testing methods are used, then photosensitive device degradation can be tested, but the testing process is destructive

Engineering Contradiction:
Improvedevice performance assessmentVSAvoiddevice damage during testing
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent implements preliminary non-destructive evaluation protocols that assess device performance at multiple stages during accelerated degradation testing, allowing early detection of failure modes without completely destroying the device, thereby preserving valuable test specimens for further analysis

Inventive Principle:
Principle #10Preliminary action

4Measurement precision

If conventional degradation testing methods are used, then photosensitive device degradation can be tested, but the accuracy of determining performance is insufficient

Engineering Contradiction:
Improveperformance measurement accuracyVSAvoidtesting duration
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent implements continuous feedback mechanisms through automated monitoring systems that track device performance parameters in real-time during accelerated degradation testing, enabling dynamic adjustment of test conditions and precise determination of degradation rates with high measurement accuracy

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces testing time and costs, enhances accuracy, and allows for the determination of degradation rates, thereby reducing the risk of unexpected failures and improving the efficiency of photosensitive device implementation and maintenance.

Implementation Method 1

The light intensity for a light source is set, wherein the light source exposes one or more photosensitive devices with light at the set light intensity

Methodology Applied
Scientific EffectLight emission: Light Emitting Diode

Data Source

PatentUS11863122B2System and method for testing photosensitive device degradation
Publication Date: 2024.01.02 CUBICPV INC
  • US11863122B2 patent drawing
  • US11863122B2 patent drawing
  • US11863122B2 patent drawing

AI summary

The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.