Negative-Type Photosensitive Polyimide for Low-Temperature Imidization

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Solution Overview

Problem

Conventional polyimide resin curing at low temperatures results in insufficient imidization, leading to inadequate chemical resistance, and negative-type photosensitive polyimides lack rigorous in-plane uniformity and resolution.

Innovation Solution

A negative-type photosensitive resin composition with a polyimide precursor having a specific weight-average molecular weight and reactive substituents, allowing imidization at low temperatures and improving film thickness uniformity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If high temperature curing is used to achieve complete imidization and high chemical resistance, then chemical resistance is improved, but chip yields deteriorate due to temperature sensitivity

Engineering Contradiction:
Improvechemical resistanceVSAvoidchip yields
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent changes the molecular weight parameter of the polyimide precursor to a specific range (3,000 ≤ Mw < 16,000) to enable complete imidization at low temperatures (200°C or below), thereby achieving high chemical resistance without exposing temperature-sensitive chips to high temperatures

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces thermal energy input (high temperature curing) with chemical structure optimization (controlled molecular weight polyimide precursor) to achieve the same imidization effect at lower temperatures, protecting temperature-sensitive electronic components

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Productivity

If low temperature curing is used to protect chip yields, then productivity is improved, but imidization is insufficient and chemical resistance deteriorates

Engineering Contradiction:
Improvechip yieldsVSAvoidchemical resistance
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent optimizes the molecular weight parameter of the polyimide precursor to a specific range (3,000 ≤ Mw < 16,000) to enable complete imidization reaction at low temperatures (200°C or below), achieving both high chip yields and high chemical resistance simultaneously

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If positive-type photosensitive polyimide is used to achieve high resolution, then measurement precision is improved, but in-plane uniformity of film thickness deteriorates due to strict uniformity requirements

Engineering Contradiction:
ImproveresolutionVSAvoidin-plane uniformity of film thickness
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent inverts the conventional approach by using negative-type photosensitive polyimide instead of positive-type, achieving high resolution through the specific molecular weight range (3,000 ≤ Mw < 16,000) while avoiding the strict in-plane uniformity requirements that plague positive-type materials

Inventive Principle:
Principle #13The other way round (Inversion)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The composition achieves high chemical resistance and in-plane uniformity of the resin layer, enabling effective low-temperature curing and improved pattern precision.

Implementation Method 1

a photopolymerization initiator (B)

Methodology Applied
Scientific EffectPhotopolymerization: Photopolymerisation

Implementation Method 2

thermal imidization treatment involving coating, exposure, development and curing of the compositions

Methodology Applied
Scientific EffectThermal imidization:

Data Source

PatentUS12613465B2Photosensitive resin composition and method for producing cured relief pattern
Publication Date: 2026.04.28 ASAHI KASEI KOGYO KABUSHIKI KAISHA
  • US12613465B2 patent drawing
  • US12613465B2 patent drawing
  • US12613465B2 patent drawing

AI summary

A negative-type photosensitive resin composition that has a satisfactory imidization rate and can yield a resin layer with high chemical resistance, even under low-temperature curing conditions of 200° C. or below, the negative-type photosensitive resin composition containing a photopolymerization initiator (B) in a proportion of 0.1 part by mass to 20 parts by mass with respect to 100 parts by mass of a polyimide precursor (A), the polyimide precursor (A) being a polyamic acid ester or polyamic acid salt with a specific structure, and the weight-average molecular weight (Mw) of the polyimide precursor (A) being 3,000 or greater and less than 16,000, in terms of polystyrene, according to gel permeation chromatography (GPC).