Photosensitive Resin Composition for Copper and Nickel Plating Resist

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Solution Overview

Problem

Resists used for manufacturing copper column solder bumps need to be compatible with both copper and nickel plating processes, while maintaining resolution and preventing swelling or cracking.

Innovation Solution

A photosensitive resin composition comprising specific structural units and a photoacid generator, applied as a resist pattern, which includes a polymer with acid dissociable groups and a hydroxyaryl group, allowing for improved glass transition temperature and dissolution rate, enabling compatibility with both copper and nickel plating without swelling or cracking.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a resist is used for both copper plating and nickel plating, then versatility is improved, but the resist may swell or crack during plating processes

Engineering Contradiction:
Improvecompatibility with both copper and nickel platingVSAvoidresist pattern stability during plating
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent modifies the chemical composition parameters of the resist by incorporating specific structural units (a1), (a2), and (a3) with controlled ratios. Unit (a3) containing hydroxyaryl groups provides crosslinking capability that prevents swelling, while units (a1) and (a2) ensure solubility and pattern formation. The balanced composition enables the resist to withstand both copper and nickel plating solutions without swelling or cracking.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The resist composition is designed as a composite polymer system combining multiple structural units with different functions. Unit (a1) provides base polymer structure, unit (a2) enhances solubility and pattern definition, and unit (a3) provides crosslinking for swelling resistance. This composite structure allows the single resist to perform reliably in both copper and nickel plating applications.

Inventive Principle:
Principle #40Composite materials

2Reliability

If the resist pattern is made more resistant to plating solutions, then swelling and cracking are prevented, but the resolution may deteriorate

Engineering Contradiction:
Improveresistance to plating solution swelling and crackingVSAvoidpattern resolution
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent applies local quality by giving different structural units different functions within the same polymer. Unit (a3) with hydroxyaryl groups is specifically designed for crosslinking to provide swelling resistance where needed, while units (a1) and (a2) maintain the polymer's ability to form fine patterns. The spatial distribution and ratio control of these units allow simultaneous achievement of resolution and swelling resistance.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent optimizes the ratio parameters of structural units to balance resolution and swelling resistance. By controlling the content of unit (a3) at 5-70 mol% and units (a1)+(a2) at 5-60 mol%, the resist achieves sufficient crosslinking for swelling resistance while maintaining adequate solubility and pattern definition capability for high resolution.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The photosensitive resin composition achieves excellent resolution and prevents swelling or cracking during copper or nickel plating, ensuring the formation of reliable resist patterns for solder bumps.

Implementation Method 1

a photoacid generator (B)

Methodology Applied
Scientific EffectPhotoacid generation: Photopolymerisation

Implementation Method 2

a polymer (A) having a structural unit (a1) represented by the following formula (a1), a structural unit (a2) represented by the following formula (a2), and a structural unit (a3) represented by the following formula (a3)... R13 and R23 each independently represent an acid dissociable group

Methodology Applied
Scientific EffectAcid dissociation: Hydrolysis

Data Source

PatentUS12158700B2Photosensitive resin composition, method for forming resist pattern, method for manufacturing plated molded article, and semiconductor apparatus
Publication Date: 2024.12.03 JSR CORPORATION
  • US12158700B2 patent drawing
  • US12158700B2 patent drawing
  • US12158700B2 patent drawing

AI summary

The present photosensitive resin composition includes a polymer (A) having a structural unit (a1) represented by a formula (a1), a structural unit (a2) represented by a formula (a2), and a structural unit (a3) represented by a formula (a3), and a photoacid generator (B). In the formulae (a1) to (a3), R12, R22, and R32 each independently represent an organic group having 1 to 10 carbon atoms; R21 represents a substituted or non-substituted alkyl group having 1 to 10 carbon atoms; R31 represents a hydrogen atom, a substituted or non-substituted alkyl group having 1 to 10 carbon atoms, or a halogen atom; R13 and R23 each independently represent an acid dissociable group; R33 represents a hydroxyaryl group; and l, m and n independently represent an integer from 0 to 10.