Photothermal Layer Thickness Measurement for Large Coated Components
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Solution Overview
Problem
Existing photothermal methods struggle to reliably determine the layer thickness of large coated components, such as vehicle bumpers, for effective quality control.
Innovation Solution
The method involves simultaneously or successively irradiating several adjacent surface areas with a radiation source, detecting the thermal radiation emitted, and using an evaluation device to create a graphically representable layer thickness profile by comparing the detected thermal radiation profile with calibration curves.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a single point irradiation method is used, then the measurement device is simple and easy to operate, but it cannot determine layer thickness on large coated components efficiently
Solution Approach 1:
The patent divides the measurement task into multiple segments by using multiple radiation sources that irradiate different surface areas simultaneously or successively. This allows the measurement of large coated components to be broken down into manageable sections, improving productivity while maintaining operational simplicity through automated scanning or array-based measurement.
Solution Approach 2:
The patent combines multiple radiation sources and detection channels into a single integrated measurement system. By merging multiple single-point measurement capabilities into one device that can measure multiple areas simultaneously or in sequence, it achieves both high productivity and ease of operation through unified control and processing.
2Productivity
If multiple surface areas are measured simultaneously or successively, then productivity and measurement coverage improve, but device complexity increases
Solution Approach 1:
The patent implements a universal measurement platform that can measure multiple surface areas using the same fundamental photothermal principle. The system uses identical radiation sources and detection mechanisms for each measurement point, reducing overall complexity through standardization while achieving high productivity through parallel or sequential operation of multiple channels.
Solution Approach 2:
The patent employs periodic scanning or sequential activation of multiple radiation sources and detection channels. By measuring different surface areas in a systematic sequence rather than requiring all components to operate simultaneously, the system achieves comprehensive coverage and high productivity while managing device complexity through time-division multiplexing.
3Reliability
If the entire surface is measured to create a layer thickness profile, then measurement completeness and quality control improve, but measurement time and processing complexity increase
Solution Approach 1:
The patent segments the large surface into multiple smaller measurement zones that can be measured in parallel or in optimized sequences. This segmentation allows the complete surface to be covered for reliable quality control while reducing total measurement time by simultaneously measuring multiple segments or by intelligently selecting critical measurement points.
Solution Approach 2:
The patent applies partial measurement strategies where not every point on the surface needs to be measured with equal detail. By focusing measurement resources on critical areas or using a grid of measurement points rather than continuous scanning, the system achieves sufficient reliability for quality control while minimizing measurement time and processing requirements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for precise and reliable determination of layer thickness on large coated components, enabling simple and effective quality control by identifying areas with layer thicknesses outside specified limits.
Implementation Method 1
at least one surface region of the coated substrate is heated exclusively by irradiation with at least one radiation source
Implementation Method 2
thermal radiation emitted by the at least one surface region is detected by a detection device
Data Source
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AI summary
The invention relates to a method for determining a layer thickness of a layer applied to a substrate (2-2g), in particular a layer thickness of a coating layer, in which method at least one surface region (7-7c; 22-25; 22e-25e; 27; 7g) of the coated substrate (2-2g) is heated by irradiation using at least one radiation source (5-5b; 5c, 19; 5d-g) and/or inductively, and thermal radiation emitted by the at least one surface region (7-7c; 22-25; 22e-25e; 27; 7g) is detected by a detection apparatus (8-8g). Advantageously, the layer thickness is determined on the basis of the emitted thermal radiation. The at least one surface region is irradiated by the at least one radiation source and heats up and/or is inductively heated. Thermal radiation emitted by the surface region is characteristic of a determined layer thickness, is detected by the detection apparatus and is transmitted to the evaluation apparatus. By comparing a detected thermal radiation curve with a calibration curve, the evaluation apparatus can determine the layer thickness and output a measured value. The invention also relates to a device for determining the layer thickness of a layer applied to a substrate.