Tunable PIC Laser Wavelength Locking With Integrated Optical Feedback
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Solution Overview
Problem
Existing opto-electronic systems face challenges in achieving fast and precise control of semiconductor-based tunable laser sources due to unintentional wavelength changes, requiring cumbersome external equipment and slow tuning processes.
Innovation Solution
An opto-electronic system that utilizes an integrated optical measurement unit to determine relative intensity noise as a feedback signal for controlling the linewidth of the laser source, eliminating the need for external optical measurement equipment and enabling faster, more accurate wavelength locking.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external wavelength locker equipment is used to control the operating wavelength, then wavelength control precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent integrates the wavelength control function directly into the semiconductor laser device by incorporating a wavelength-dependent optical filter and detector within the laser cavity structure. This merging eliminates the need for separate external wavelength locker equipment, thereby reducing device complexity and cost while maintaining wavelength control precision through the integrated feedback mechanism.
Solution Approach 2:
The semiconductor laser device performs its own wavelength monitoring and control through the integrated optical filter and detector that provide real-time feedback about the emitted wavelength. The device serves itself by using a portion of its own emitted light for wavelength sensing and adjustment, eliminating dependence on external measurement equipment.
2Measurement precision
If external wavelength locker equipment is used, then wavelength measurement accuracy is improved, but ease of operation deteriorates due to cumbersome optical alignment
Solution Approach 1:
By merging the wavelength measurement function into the laser device itself through integrated optical components, the patent eliminates the need for separate external equipment that requires complex optical alignment. The integrated structure ensures proper optical coupling by design, making the device easier to operate while maintaining measurement accuracy.
3Measurement precision
If external equipment is used for wavelength control, then wavelength locking precision is improved, but tuning speed deteriorates
Solution Approach 1:
The integration of the optical filter and detector within the laser device creates a compact feedback loop with minimal signal transmission paths. This eliminates the time delays associated with external equipment and optical alignment adjustments, enabling faster wavelength tuning while maintaining locking precision through the direct feedback mechanism.
4Manufacturing precision
If calibration is performed externally after dicing and mounting, then manufacturing precision is improved, but productivity deteriorates due to long processing times
Solution Approach 1:
The patent incorporates the wavelength control functionality directly into the laser device structure during fabrication, enabling calibration to be performed earlier in the manufacturing process rather than requiring post-assembly external calibration. This preliminary integration of control functions reduces overall processing time and improves productivity while maintaining calibration precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system allows for rapid and precise tuning of the semiconductor-based tunable laser source, reducing costs and eliminating the need for cumbersome optical alignment, thereby enhancing performance in optical telecommunication and sensor applications.
Implementation Method 1
an optical measurement unit 4 that is configured and arranged to receive the optical radiation emitted by the semiconductor-based tunable laser source 3 and provide at least one signal that is representative for the received optical radiation
Data Source
Figure 1~2
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Figure 4
AI summary
The invention relates to an opto-electronic system (1) comprising a PIC (2) that comprises a semiconductor-based tunable laser source (3) that can achieve single-mode lasing thereby emitting optical radiation having a predefined linewidth at a predefined operating wavelength. The PIC also comprises an optical measurement unit (4) that can receive the optical radiation emitted by said laser source, and provide a signal representative for the received optical radiation to a control unit (5) of the opto-electronic system that is operatively connected with said laser source and the optical measurement unit. The opto-electronic system enables omitting external optical measurement equipment thereby enabling a faster and cheaper way of locking of the predefined operating wavelength of said laser and achieving the predefined linewidth. The invention also relates to a method (100) of improved tuning of a semiconductor-based tunable laser source of an opto-electronic system according to the invention.