Picker Tip Substrate Surface Detection via Laser Feedback
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Solution Overview
Problem
Current systems for detecting a substrate surface within a scanner lack efficiency and accuracy, particularly in isolating target analytes from substrates like well plates or slides, as they rely on primitive detection methods that are not precise enough for modern research needs.
Innovation Solution
A system and method utilizing a picker with a picker tip driven by a z-axis motor system, combined with a turret and position detector, which includes a closed feedback loop to accurately locate and detect the substrate surface by calculating differences in output voltages from position sensors, enabling precise contact and analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If primitive detection methods are used to detect substrate surface, then device complexity is reduced, but measurement precision deteriorates
Solution Approach 1:
The patent replaces mechanical contact-based detection methods with optical detection using a position sensor and laser. The laser reflects off the substrate surface and the position sensor detects the reflected light position, enabling non-contact, high-precision measurement of substrate surface location without mechanical wear or contamination
Solution Approach 2:
The patent introduces a laser as an intermediary between the detection system and substrate surface. The laser beam serves as a mediator that carries information about substrate position and orientation back to the position sensor, enabling indirect but highly accurate measurement without direct mechanical contact
2Measurement precision
If overtravel is minimized for precise contact detection, then measurement precision improves, but detection time increases
Solution Approach 1:
The patent performs preliminary detection by monitoring the position sensor output as the picker approaches the substrate. The system continuously tracks the reflected laser position and identifies the exact moment of contact or near-contact, eliminating the need for significant overtravel and enabling precise detection at the optimal contact point
Solution Approach 2:
The patent implements a feedback mechanism where the position sensor continuously provides real-time information about substrate location to the control system. This closed-loop feedback enables dynamic adjustment of picker position and detection timing, allowing precise contact detection without excessive overtravel by responding to real-time position data
Data Source
AI summary
This disclosure is directed to a system and method for detecting a surface of a substrate within a scanner.