Piezoelectric Laminate Oxygen-18 Isotope Enrichment

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Solution Overview

Problem

Existing piezoelectric films made from perovskite-type oxides, such as PZT, face issues with stability and long-term reliability due to oxygen deficiency, leading to decreased dielectric breakdown voltage and piezoelectric constant when insulating layers are used to compensate for oxygen pores.

Innovation Solution

Incorporating an excess of oxygen-18 (18O) into the piezoelectric film, specifically a Pb-containing perovskite-type oxide, to enhance dielectric breakdown voltage without reducing the piezoelectric constant, by using a sputtering process that includes 18O in the film-forming gas, resulting in a piezoelectric laminate with improved structural stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If an insulating layer is provided between the piezoelectric film and the electrode to increase the dielectric breakdown voltage, then the dielectric breakdown voltage is improved, but the piezoelectric constant is decreased

Engineering Contradiction:
Improvedielectric breakdown voltageVSAvoidpiezoelectric constant
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent changes the chemical composition parameter of the piezoelectric film by incorporating oxygen-18 isotope, transforming the film's properties to achieve both high dielectric breakdown voltage and maintained piezoelectric constant without requiring additional insulating layers

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates a composite piezoelectric film structure containing both oxygen-16 and oxygen-18 isotopes, where the oxygen-18 enrichment provides dielectric stability while maintaining the perovskite structure's piezoelectric properties

Inventive Principle:
Principle #40Composite materials

2Reliability

If a metal oxide layer is provided to compensate for oxygen pores in the piezoelectric film, then the piezoelectric characteristics are suppressed from deteriorating, but the piezoelectric constant is decreased

Engineering Contradiction:
Improvepiezoelectric characteristic stabilityVSAvoidpiezoelectric constant
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent changes the isotopic composition of oxygen in the piezoelectric film, enriching it with oxygen-18, which fundamentally alters the film's resistance to oxygen deficiency without requiring compensatory metal oxide layers

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The increased ratio of 18O in the piezoelectric film suppresses oxygen defects, thereby improving the dielectric breakdown voltage and maintaining the piezoelectric constant, enhancing the long-term reliability of the piezoelectric element.

Implementation Method 1

using a sputtering process that includes 18O in the film-forming gas

Methodology Applied
Scientific EffectSputtering: Sputtering

Implementation Method 2

A piezoelectric body consisting of a perovskite-type oxide is applied as a piezoelectric film in a piezoelectric element

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Data Source

PatentUS20230270014A1Piezoelectric laminate, piezoelectric element, and manufacturing method for piezoelectric laminate
Publication Date: 2023.08.24 FUJIFILM CORP
  • US20230270014A1 patent drawing

AI summary

There is provided a piezoelectric laminate including, in the following order, a lower electrode layer and a piezoelectric film containing a Pb-containing perovskite-type oxide, in which the piezoelectric film contains an oxygen atom 18O having a mass number of 18 in oxygen as a constituent element in excess of a natural abundance ratio. There are also provided a piezoelectric laminate, a piezoelectric element, and a manufacturing method for a piezoelectric laminate.